原位测量金刚石压砧在高压下的杯型形变
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摘要
基于白光频域干涉的基本原理,提出了一种可实现高压下金刚石压砧杯型形变原位测量的方法。简单介绍了利用频域干涉技术测量金刚石压砧在高压下的杯型形变的基本原理,并开展了实验研究,实验最高压力达到42.1GPa。实验结果显示,金刚石压砧的杯型形变与压力呈线性关系,最大值达到11.1μm,从实验上证实了最近的有限元数值模拟结果。
In this research we presented a novel method based on frequency domain interferometry to in situ measure the cupping deformation of diamond anvils under high pressures.First we introduced the working principle of the cupping deformation measurements based on the frequency domain interferometry,and then we carried out the experiments under high pressures.The cupping deformation of diamond anvils is obtained under high pressures up to 42.1 GPa,and its maximum value reaches 11.1μm.The experimental results show that the cupping deformation increases linearly with the pressure.Our work verify the recent finite element modeling calculations.
In this research we presented a novel method based on frequency domain interferometry to in situ measure the cupping deformation of diamond anvils under high pressures.First we introduced the working principle of the cupping deformation measurements based on the frequency domain interferometry,and then we carried out the experiments under high pressures.The cupping deformation of diamond anvils is obtained under high pressures up to 42.1 GPa,and its maximum value reaches 11.1μm.The experimental results show that the cupping deformation increases linearly with the pressure.Our work verify the recent finite element modeling calculations.
引文
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[20]JING Q M,WU Q,LIU L,et al.An experimental study on SrB4O7:Sm2+as a pressure sensor[J].Journal of Applied Physics,2013,113:023507.
[2]MERKEL S,HEMLEY R J,MAO H K.Finite-element modeling of diamond deformation at multimegabar pressures[J].Applied Physics Letters,1999,74(5):656-658.
[3]LI M,GAO C X,PENG G,et al.Thickness measurement of sample in diamond anvil cell[J].Review of Scientific Instruments,2007,78(7):075106.
[4]LIU S G,LI Z R,JING Q M,et al.A novel method to measure the deformation of diamond anvils under high pressure[J].Review of Scientific Instruments,2014,85(4):046113.
[5]敬秋民,吴强,毕延,等.DAC加载金刚石和样品变形实验与模拟研究[J].高压物理学报,2013,27(3):411-416.JING Q M,WU Q,BI Y,et al.Experimental study and numerical simulation on deformation of diamond and sample under DAC loading[J].Chinese Journal of High Pressure Physics,2013,27(3):411-416.
[6]SUNG C M,GOETZE C.Pressure distribution in the diamond anvil press and the shear strength of fayalite[J].Review of Scientific Instruments,1977,48(11):1386-1391.
[7]JING Q M,BI Y,WU Q,et al.Yield strength of molybdenum at high pressures[J].Review of Scientific Instruments,2007,78(7):073906.
[8]GAO C X,HAN Y H,MA Y Z,et al.Accurate measurements of high pressure resistivity in a diamond anvil cell[J].Review of Scientific Instruments,2005,76(8):083912.
[9]MOSS W C,HALLQUIST J O,REICHLIN R,et al.Finite element analysis of the diamond anvil cell:achieving 4.6Mbar[J].Applied Physics Letters,1986,48(19):1258-1260.
[10]WENG J D,TAO T J,LIU S G,et al.Optical-fiber frequency domain interferometer with nanometer resolution and centimeter measuring range[J].Review of Scientific Instruments,2013,84(11):113103.
[11]江毅.光纤白光干涉测量术新进展[J].中国激光,2010,37(6):1413-1420.JIANG Y.Progress in fiber optic white-light interferometry[J].Chinese Journal of Lasers,2010,37(6):1413-1420.
[12]王军,陈磊,吴泉英,等.一种基于白光干涉迈克尔逊干涉仪波片延迟量的测量方法[J].中国激光,2011,38(5):1413-1420.WANG J,CHEN L,WU Q Y,et al.Retardation measurement of wave plates using white-light Michelson interferometer[J].Chinese Journal of Lasers,2011,38(5):1413-1420.
[13]BRUNDAVANAM M M,VISWANATHAN N K,RAO D N.Nanodisplacement measurement using spectral shifts in a white-light interferometer[J].Applied Optics,2008,47(34):6334-6339.
[14]MANOJLOVI C'L M.A simple white-light fiber-optic interferometric sensing system for absolute position measurement[J].Optics and Lasers in Engineering,2010,48(4):486-490.
[15]KUMAR V N,RAO D N.Using interference in the frequency domain for precise determination of thickness and refractive indices of normal dispersive materials[J].Journal Optical Society of America B,1995,12(9):1559-1563.
[16]DU Y L,YAN H M,WU Y,et al.Non-contact thickness measurement for ultra-thin metal foils with differential white light intetferometry[J].Chinese Optics Letters,2004,2(12):701-703.
[17]AKAHAMA Y,KAWAMURA H.High-pressure Raman spectroscopy of diamond anvils to 250GPa:method for pressure determination in the multimegabar pressure range[J].Journal of Applied Physics,2004,96(7):3748-3751.
[18]HANFLAND M,SYASSEN K.A Raman study of diamond anvils under stress[J].Journal of Applied Physics,2004,57(8):2752-2756.
[19]BALZARETTI N M,DA JORNADA J A H.Pressure dependence of refractive index of diamond,cubic silicon carbide and cubic boron nitride[J].Solid State Communication,1996,99(12):943-948.
[20]JING Q M,WU Q,LIU L,et al.An experimental study on SrB4O7:Sm2+as a pressure sensor[J].Journal of Applied Physics,2013,113:023507.