摘要
在介绍轨道电路组成结构和工作原理的基础上,分析了轨道电路空闲时红光带的产生原因。结合上海轨道交通2号线铁屑造成绝缘节短路而引起红光带故障频发的案例,通过现场调研、材料对比分析、列车进出站牵引计算等手段,找出了铁屑的来源,分析了铁屑的形成机理,给出了相应的解决对策。
With an introduction to the structure and working principle of metro track circuit,the causes of red band in track circuit idle time are analyzed. Combined with a case study of frequent red light belt failure,when the short circuit on insulation section of Shanghai metro Line 2 was caused by iron chips,the source of iron chips is finally detected through field investigation,comparative analysis of materials,traction calculation of vehicle entrance and exit at station,and so on. The forming mechanism of iron chips is analyzed and corresponding treatment measures are provided.
引文
[1]米根锁,杨润霞,梁利.基于组合模型的轨道电路复杂故障诊断方法研究[J].铁道学报,2014,36(10):65-69.
[2]张友鹏,祁欢,赵斌.轨道电路分路态检测方法研究[J].铁道学报,2017,39(1):70-75.
[3]黄赞武.轨道电路故障预测与健康管理关键技术研究[D].北京:北京交通大学,2013.
[4]韩旭东.电气化铁路轨道电路红光带的原因分析及减少轨道电路红光带的措施[J].科学咨询(科技·管理),2013(6):63-65.
[5]陈璐,张正光.轨道电路空闲红光带原因及解决方法[J].铁路通信信号工程技术,2012,9(3):64-65.
[6]王明媚.关于短区间轨道电路改方闪红光带问题分析[J].铁路通信信号工程技术,2017,14(1):94-96.