基于缺陷报告分析的软件缺陷定位方法
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  • 英文篇名:Software Defect Location Method Based on Analysis of Bug Report
  • 作者:高子欣 ; 赵逢禹 ; 刘亚
  • 英文作者:GAO Zi-xin;ZHAO Feng-yu;LIU Ya;School of Optical-Electrical and Computer Engineering, University of Shanghai for Science and technology;
  • 关键词:缺陷定位 ; 缺陷报告 ; 结构相似 ; 异常堆栈信息
  • 英文关键词:Bug localization;;Bug report;;Similar structure;;Stack information
  • 中文刊名:RJZZ
  • 英文刊名:Computer Engineering & Software
  • 机构:上海理工大学光电信息与计算机工程学院;
  • 出版日期:2019-05-15
  • 出版单位:软件
  • 年:2019
  • 期:v.40;No.469
  • 基金:国家自然科学青年基金项目(批准号:61402288)
  • 语种:中文;
  • 页:RJZZ201905002
  • 页数:8
  • CN:05
  • ISSN:12-1151/TP
  • 分类号:14-21
摘要
在软件开发过程中,软件缺陷是不可避免的。在缺陷跟踪系统中,一个重要的问题是如何根据用户所提交的缺陷报告,进行缺陷的自动定位。本文在综合考虑缺陷报告与源代码文件结构相似性的基础上,进一步分析已修复缺陷报告、缺陷报告中的异常堆栈(StackTrace)信息对软件缺陷定位的作用,从而提高定位的精度。在Eclipse、AspectJ和SWT开源项目数据程序集上进行相关实验,并与Buglocator、BRTracer和BLUiR缺陷定位方法进行了比较分析,实验结果表明,本文方法能显著提高软件缺陷定位的精度。
        Software defects are inevitable during the software development process. In the defect tracking system,an important issue is how to automatically locate defects based on the bug report submitted by the user. Based on the comprehensive consideration of the structural similarity between the defect report and the source code file, this paper further analyzes the effect of the abnormal stack information in the fixed defect report and defect report on the software defect location, thus improving the positioning accuracy. Related experiments are carried out on the Eclipse,Aspect J and SWT open source project data assemblies, and compared with Buglocator, BRTracer and BLUiR defect location methods. The experimental results show that the proposed method can significantly improve the accuracy of software defect location.
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