高速模数转换器RHF1201测试技术研究
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摘要
论文介绍高速模数转换器RHF1201特性,在测试项目动态参数开发过程如何选择合适的测试资源,设计适合器件测试的接口电路,减少噪声的引入满足动态参数的测试。
This paper introduces the characteristics of high speed analog-to-digital converter RHF1201,how to choose suitable testing sources in the process of testing dynamic parameter development of the program,design interface circuit suitable for device testing,and reduce the introduction of noise to satisfy the testing of dynamic parameters.
This paper introduces the characteristics of high speed analog-to-digital converter RHF1201,how to choose suitable testing sources in the process of testing dynamic parameter development of the program,design interface circuit suitable for device testing,and reduce the introduction of noise to satisfy the testing of dynamic parameters.
引文
[1]布莱德,博兰罗,罗伯里兹.理解高速模数转换器的测试和评估[J].亚德诺公司应用笔记,835:7-8.Brad Brannon,Rob Reeder. Understanding High SpeedADC testing and Evaluation[J]. ADI Application Note,835:7-8.
[2]布莱德博兰罗.采样数据系统的基础[J].亚德诺公司应用笔记,282:1.Brad Brannon. Fundamental of sampled data system[J].ADI Application Note,282:1.
[3]布莱德博兰罗,爱伦巴洛.抖动的不确定度及模数转换器的系统性能[J].亚德诺公司应用笔记第,501:1.Brad Brannon,Allen Barlo.Aperture Uncertainty and ADCsystem performance[J]. ADI Application Note,501:1.
[4]罗伯里兹.高速模数转换器印制电路板的布线技术[J].亚德诺公司应用笔记,1142:5.Rob Reeder. Techniques for high speed ADC PCB layout[J]. ADI Application Note,1142:5.
[5]珀布洛克,杰弗巴洛.高低频电路的接地[J].亚德诺公司应用笔记第,345:3.Paul Brokaw,Jeff Barrow. Grounding for low-and high-frequency circuits[J]. ADI Application Note,345:3.
[6]布莱德博兰罗.采样系统和时钟相位噪声及抖动效应[J].亚德诺公司应用笔记,756:2.Brad Brannon. Sampled systems and the effects of clockphase noise and jitter[J]. ADI Application Note,756:2.
[7]凌特. 16位20M采样率模数转换器,信噪比84dB,46uV参考输入噪声[J].电子技术应用,2012:11.Linear Ltd.16bit 20Msps ADC,84dB SNR,46uV input ref-erence noise[J]. Application of Electronic Technique,2012,11.
[8]Mark Burns,Gordon W. Roberts.混合信号集成电路测试和测量[M].伦敦:牛津大学出版,2001:462-467.Mark Burns,Gordon W. Roberts. An Introduction toMixed-Signal SOC Test and Measurement[M]. London:Oxford University Press,2001:462-467.
[9]软测公司.混合信号测试的基础[M]. 2001:263-293.Soft test Inc. The fundamentals of mixed signal testing[M]. Edition1,2001:263-293.
[10]Matthew Mahoney.基于数字信号处理的模拟和混合电路测试[J].电气和电子工程师协会,1987,11(4):146-151.Matthew Mahoney. DSP-BASED TESTING OF Analogand Mixed-Signal Circuits[J].Computer society Press ofthe IEEE,1987,11(4):146-151.
[11]谢鹏.高速ADC器件的动态测试技术研究[J].电子元器件应用,2009,11(9):82-84.XIE Peng. High Speed ADC device dynamic test techni-cal research[J]. Application of Electronic components,2009,11(9):82-84.
[2]布莱德博兰罗.采样数据系统的基础[J].亚德诺公司应用笔记,282:1.Brad Brannon. Fundamental of sampled data system[J].ADI Application Note,282:1.
[3]布莱德博兰罗,爱伦巴洛.抖动的不确定度及模数转换器的系统性能[J].亚德诺公司应用笔记第,501:1.Brad Brannon,Allen Barlo.Aperture Uncertainty and ADCsystem performance[J]. ADI Application Note,501:1.
[4]罗伯里兹.高速模数转换器印制电路板的布线技术[J].亚德诺公司应用笔记,1142:5.Rob Reeder. Techniques for high speed ADC PCB layout[J]. ADI Application Note,1142:5.
[5]珀布洛克,杰弗巴洛.高低频电路的接地[J].亚德诺公司应用笔记第,345:3.Paul Brokaw,Jeff Barrow. Grounding for low-and high-frequency circuits[J]. ADI Application Note,345:3.
[6]布莱德博兰罗.采样系统和时钟相位噪声及抖动效应[J].亚德诺公司应用笔记,756:2.Brad Brannon. Sampled systems and the effects of clockphase noise and jitter[J]. ADI Application Note,756:2.
[7]凌特. 16位20M采样率模数转换器,信噪比84dB,46uV参考输入噪声[J].电子技术应用,2012:11.Linear Ltd.16bit 20Msps ADC,84dB SNR,46uV input ref-erence noise[J]. Application of Electronic Technique,2012,11.
[8]Mark Burns,Gordon W. Roberts.混合信号集成电路测试和测量[M].伦敦:牛津大学出版,2001:462-467.Mark Burns,Gordon W. Roberts. An Introduction toMixed-Signal SOC Test and Measurement[M]. London:Oxford University Press,2001:462-467.
[9]软测公司.混合信号测试的基础[M]. 2001:263-293.Soft test Inc. The fundamentals of mixed signal testing[M]. Edition1,2001:263-293.
[10]Matthew Mahoney.基于数字信号处理的模拟和混合电路测试[J].电气和电子工程师协会,1987,11(4):146-151.Matthew Mahoney. DSP-BASED TESTING OF Analogand Mixed-Signal Circuits[J].Computer society Press ofthe IEEE,1987,11(4):146-151.
[11]谢鹏.高速ADC器件的动态测试技术研究[J].电子元器件应用,2009,11(9):82-84.XIE Peng. High Speed ADC device dynamic test techni-cal research[J]. Application of Electronic components,2009,11(9):82-84.