qPlus型非接触原子力显微技术进展及前沿应用
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摘要
原子力显微镜(AFM)通过探测针尖与样品之间的相互作用力获得样品表面的结构信息。基于qPlus传感器的非接触原子力显微镜(NC-AFM)在传统AFM的基础上进一步提升了空间分辨率,为研究表面物理和化学过程提供了一种新的成像和谱学研究技术。本文首先介绍NC-AFM的基本构造、高分辨成像机制和力谱测量等工作原理,总结了近年来NC-AFM在表面在位化学反应、低维材料表征和表面电荷分布测量等方面的应用,探讨了NC-AFM技术的发展与完善,展望了NC-AFM面临的机遇和挑战。
Atomic force microscopy(AFM) is used to investigate surface structures by measuring the interaction force between the tip and sample. Non- contact AFM(NC- AFM) that incorporates a q Plus sensor further enhances the spatial resolution of scanning probe microscopy based on traditional AFM principles. In this perspective, we give a brief introduction to the mechanisms of high-resolution imaging and force measurements using NC- AFM. We then summarize recent applications of NC- AFM in the fields of on- surface chemical reactions, low-dimensional materials, surface charge distribution in molecules, as well as technical improvements and developments of NC-AFM technologies. The opportunities and challenges for NC-AFM technologies are also presented.
Atomic force microscopy(AFM) is used to investigate surface structures by measuring the interaction force between the tip and sample. Non- contact AFM(NC- AFM) that incorporates a q Plus sensor further enhances the spatial resolution of scanning probe microscopy based on traditional AFM principles. In this perspective, we give a brief introduction to the mechanisms of high-resolution imaging and force measurements using NC- AFM. We then summarize recent applications of NC- AFM in the fields of on- surface chemical reactions, low-dimensional materials, surface charge distribution in molecules, as well as technical improvements and developments of NC-AFM technologies. The opportunities and challenges for NC-AFM technologies are also presented.
引文
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