摘要
目前矿石中低含量钨的测定方法一般采用分光光度法以及ICP-AES法,随着分析技术手段的不断开发创新,ICP-MS法在痕量分析领域上优势明显。本文利用ICP-MS高分辨率、高灵敏度、低检测限、快速分析等优点,建立一种新的仪器分析检测方法,满足工业生产中对于钽铌矿中低含量杂质元素钨快速分析的要求,优于现行的行业标准制定的分析方法。经检验,ICP-MS法的分析结果准确、可靠,可在实际中应用。
Currently,spectrophotometry method and ICP-AES method are generally used to determine low content tungsten in ores.With the continuous development and innovation of analytical techniques,ICP-MS method has obvious advantages in the field of trace analysis.In this paper,ICP-MS as a new instrument analysis and detection method with the advantages of high-resolution,high sensitivity,low detection limit and rapid analysis is established to meet the requirements of rapid analysis of low content tungsten in tantalum-niobium ores in industrial production,which is superior to current analytical methods developed by industry standards.After testing,the analytical results of ICP-AES are accurate and reliable,and can be applied in practice.
引文
[1] 陈登云,CHRISTOPHER T.ICP-MS技术及其应用[J].现代仪器,2001(4):8-11,38.
[2] 蔡彦明.无机痕量元素分析的好帮手:安捷伦ICP-MS7500i[J].农业环境与发展,2006(4):19-21.
[3] 刘宁平,刘建章,孙洪志,等.钽铌工业生产及其展望[J].稀有金属快报,2005,24(9):1-6.
[4] 周礼仙.硫氰酸盐分光光度法测定镍基合金中钨[J].冶金分析,2017,37(8):78-82.
[5] 白小叶,佡云,迟爱玲.硫氰酸盐光度法测定钼精矿中的钨[J].有色矿冶,2015,31(6):49-51.
[6] 刁憬平,秦宗兴,高银香.电感耦合等离子体原子发射光谱法测定钨矿中的钨[J].化学工程与装备,2011(7):180-181.
[7] 邹龙,刘荣丽,易师.电感耦合等离子体原子发射光谱法测定铝钨合金中钨[J].冶金分析,2014,34(11):65-68.
[8] 赵建平.硫氰酸盐分光光度法测定岩矿中钨量的改进[J].新疆有色金属,2016(1):69-72.
[9] 何蔓,胡斌,江祖成.用于研究ICP-MS中基体效应的逐级稀释法[J].高等学校化学学报,2004,25(12):2 232-2 237.
[10] 中华人民共和国工业和信息化部.YS/T 358.4—2011.钽铁、铌铁精矿化学分析方法第3部分:三氧化钨量的测定硫氰酸盐分光光度法[S].北京:中国标准出版社,2012.