基于Wiener过程的数控转台极小子样可靠性分析
详细信息    查看全文 | 推荐本文 |
  • 英文篇名:Reliability analysis of NC rotary table based on a Wiener process for extremely small samples
  • 作者:张云 ; 姜楠 ; 王立平
  • 英文作者:ZHANG Yun;JIANG Nan;WANG Liping;Beijing Key Laboratory of Precision/Ultra-Precision Manufacturing Equipments and Control,Department of Mechanical Engineering,Tsinghua University;
  • 关键词:数控转台 ; Wiener过程 ; 极大似然估计 ; 可靠性估计
  • 英文关键词:numerical control(NC)rotary table;;Wiener process;;maximum likelihood estimation;;reliability estimate
  • 中文刊名:QHXB
  • 英文刊名:Journal of Tsinghua University(Science and Technology)
  • 机构:清华大学机械工程系精密超精密制造装备及控制北京市重点实验室;
  • 出版日期:2018-11-30 10:55
  • 出版单位:清华大学学报(自然科学版)
  • 年:2019
  • 期:v.59
  • 基金:国家科技重大专项(2016ZX04004-004)
  • 语种:中文;
  • 页:QHXB201902002
  • 页数:5
  • CN:02
  • ISSN:11-2223/N
  • 分类号:9-13
摘要
针对数控转台性能退化过程较为缓慢且存在波动的特点,采用Wiener过程进行数学建模,利用极大似然法结合试验数据分析模型中各未知参数的特点。根据分析结果将模型中的漂移系数和扩散系数设为恒定值,假设性能退化初值服从正态分布,得出数控转台的相关可靠性函数,并与基于伪寿命分布法得出的结果进行比较。结果表明:基于Wiener过程得出的结果较基于伪寿命分布法得出的结果更加符合实际情况。
        The performance of numerical control(NC)rotary tables degrades slowly and oscillatorily. A Wiener process model is developed to improve the reliability estimate of NC rotary tables using the maximum likelihood method to analyze the measured characteristics of each parameter with fixed drift and diffusion coefficients assuming that the initial performance degradation values obey a normal distribution. The model gives the correlation reliability function for the NC rotary table.Comparison of the results with those of the pseudo life distribution method shows that the Wiener process model more accurately predicts the actual characteristics.
引文
[1] NELSON W.Analysis of performance-degradation data from accelerated tests[J].IEEE Transactions on Reliability,1981,R-30(2):149-155.
    [2] LU C J,MEEKER W Q.Using degradation measures to estimate a time-to-failure distribution[J].Technometrics,1993,35(2):161-174.
    [3] MEEKER W Q,ESCOBAR L A,LU C J. Accelerated degradation tests:Modeling and analysis[J].Technometrics,1998,40(2):89-99.
    [4]彭宝华,周经纶,金光.综合多种信息的金属化膜电容器可靠性评估[J].强激光与粒子束,2009,21(8):1271-1275.PENG B H,ZHOU J L,JIN G.Reliability assessment of metallized film capacitor using multiple reliability information sources[J].High Power Laser and Particle Beams,2009,21(8):1271-1275.(in Chinese)
    [5]朱德馨,刘宏昭.随机性能退化下极小样本高速列车轴承的可靠性评估[J].机械科学与技术,2013,32(10):1499-1504.ZHU D X,LIU H Z.Reliability evaluation of high-speed train bearing based on stochastic performance deterioration with minimum sample[J]. Mechanical Science and Technology for Aerospace Engineering, 2013, 32(10):1499-1504.(in Chinese)
    [6]王明磊,原大宁,刘宏昭.二元Wiener过程下的小样本电主轴可靠性分析[J].机械科学与技术,2017,36(2):279-285.WANG M L,YUAN D N,LIU H Z.Reliability analysis of motorizedspindlewithsmallsamplebasedon two-dimensional Wiener process[J].Mechanical Science and Technology for Aerospace Engineering, 2017, 36(2):279-285.(in Chinese)
    [7] WANG X. Wiener processes with random effects for degradation data[J].Journal of Multivariate Analysis,2010,101(2):340-351.
    [8] TANG J,SU T S.Estimating failure time distribution and its parameters based on intermediate data from a Wiener degradation model[J].Naval Research Logistics,2008,55(3):265-276.
    [9] NICOLAI R P, DEKKER R, NOORTWIJK J M. A comparison of models for measurable deterioration:An application to coatings on steel structures[J].Reliability Engineering and System Safety,2007,92(12):1635-1650.
    [10]WHITMORE G A.Estimating degradation by a Wiener diffusion process subject to measurement error[J].Lifetime Data Analysis,1995,1(3):307-319.
    [11]郭琦.基于性能退化数据的可靠性评估方法研究[D].广州:华南理工大学,2015.GUO Q.Research on reliability assessment methods based on performance degradation data[D].Guangzhou:South China University of Technology,2015.(in Chinese)
    [12]彭宝华.基于Wiener过程的可靠性建模方法研究[D].长沙:国防科学技术大学,2010.PENG B H.Research on reliability modeling methods based on Wiener process[D].Changsha:National University of Defense Technology,2010.(in Chinese)

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700