基于步进扫描傅里叶变换的红外光致发光研究
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摘要
搭建了红外波段的傅里叶变换光致发光谱测试系统,结合FTIR光谱仪的步进扫描功能,在室温条件下对短波和中波碲镉汞材料进行了光致发光测试。测试结果表明,相对于常规的连续谱扫描,步进扫描的方式成功地抑制了背景辐射的影响,同时还显著提高了PL谱信号的信噪比,在室温下获得了光滑的PL谱曲线。
An infrared photoluminescence(PL) measurement system was set up based on the Fourier-transform infrared spectrometer with step-scan mode. PL measurements of two Hg Cd Te thin films with cut-off wavelengths at short-wavelength and middle-wavelength were tested with the step-scan mode and conventional continuous-scan mode at room temperature. The measurement results with the step-scan mode indicated that the thermal background emission disturbance can be reduced, and the signal-to-noise ratio of the PL signal was significantly improved; hence, a rather smooth PL spectrum was obtained for the Hg Cd Te samples.
An infrared photoluminescence(PL) measurement system was set up based on the Fourier-transform infrared spectrometer with step-scan mode. PL measurements of two Hg Cd Te thin films with cut-off wavelengths at short-wavelength and middle-wavelength were tested with the step-scan mode and conventional continuous-scan mode at room temperature. The measurement results with the step-scan mode indicated that the thermal background emission disturbance can be reduced, and the signal-to-noise ratio of the PL signal was significantly improved; hence, a rather smooth PL spectrum was obtained for the Hg Cd Te samples.
引文
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[3]SHAO Jun,LV Xiang,LU Wei,et al.Cutoff wavelength of Hg1-x Cdx Te epilayers by infrared photo reflectance spectroscopy[J].Appl.Phys.Lett.,2007,90:171101.
[4]SHAO Jun,LU Wei,LV Xiang,et al.Modulated photoluminescence spectroscopy with a step-scan Fourier transform infrared spectrometer[J].Review of Scientific Instruments,2006,77:063104.
[5]JIANG E Y.Advanced FT-IR Spectroscopy[M].Madison:Thermo Electron,2003.
[2]ZHA F X,SHAO Jun,JIANG J,et al.“Blueshift”in photoluminescence and photovoltaic spectroscopy of the ion-milling formed n-on-p Hg Cd Te photodiodes[J].Appl.Phys.Lett.,2007,90:201112.
[3]SHAO Jun,LV Xiang,LU Wei,et al.Cutoff wavelength of Hg1-x Cdx Te epilayers by infrared photo reflectance spectroscopy[J].Appl.Phys.Lett.,2007,90:171101.
[4]SHAO Jun,LU Wei,LV Xiang,et al.Modulated photoluminescence spectroscopy with a step-scan Fourier transform infrared spectrometer[J].Review of Scientific Instruments,2006,77:063104.
[5]JIANG E Y.Advanced FT-IR Spectroscopy[M].Madison:Thermo Electron,2003.