电感耦合等离子体串联质谱法测定高纯镍金属中痕量硒
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摘要
使用串联四极杆电感耦合等离子体质谱仪ICAP TQ测定高纯镍中痕量硒元素。通过测定78Se和80Se两种同位素,对比考察了H_2和O_2分别作为反应气时对检出限和等效背景溶度的影响,从而确定了使用O_2作为反应气,能更加彻底地消除Ni基体产生的多原子离子干扰,且经质量转移,将测定Se~+转变为测定SeO~+,达到准确测定高纯镍金属中痕量硒的目的。实验测得了O_2模式下的~(78)Se和~(80)Se的检出限分别为2.4ng/L和8.3ng/L,加标回收率为97%～99%。
Trace Se in high purity nickel was d etermined by with tandem Quadrupole Inductively coupled plasma mass spectrometer ICP-TQ. The effects of H_2 and O_2 as reaction gases on DL and BEC were compared by measuring ~(78)Se and ~(80)Se isotopes. It was determined that using O_2 as reaction gas and transforming the determination of Se~+ into the determination of SeO~+ was more suitable for the determination of trace Se element through mass shift mode. The DL of ~(78)se and ~(80)Se in O_2 mode were 2.4 ng/L and 8.3 ng/L, respectively. The recovery of standard addition was 97-99%.
Trace Se in high purity nickel was d etermined by with tandem Quadrupole Inductively coupled plasma mass spectrometer ICP-TQ. The effects of H_2 and O_2 as reaction gases on DL and BEC were compared by measuring ~(78)Se and ~(80)Se isotopes. It was determined that using O_2 as reaction gas and transforming the determination of Se~+ into the determination of SeO~+ was more suitable for the determination of trace Se element through mass shift mode. The DL of ~(78)se and ~(80)Se in O_2 mode were 2.4 ng/L and 8.3 ng/L, respectively. The recovery of standard addition was 97-99%.
引文
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[4]张瑞霖,张为,戴学谦.ICP-AES法测定金属镍中杂质元素[J].冶金分析,2003,23(4):58-59
[5] Frank Vanhaecke, Lieve Balcaen, Eduardo Bolea-Fernandez,etc.Inductively coupled plasma e Tandem mass spectrometry(ICP-MS/MS):A powerful and universal tool for the interference-free determination of(ultra)trace elements e A tutorial review[J]. Analytica Chimica Acta,2015,894:7-19
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