基于KDE-FPBT的模拟电路测试性分析与故障诊断方法研究
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摘要
针对传统测试性模型故障分辨率低的问题,提出一种基于故障对布尔表的模拟电路测试性分析与故障诊断方法。根据故障对布尔表的特点构建新的测试性模型,研究相应的故障检测率和隔离率预计方法。基于核密度估计实现实数域样本数据到故障对布尔表的转换,并采用"一对一"的投票策略完成对实测数据的故障诊断推理。以Sallen-Key带通滤波电路为例开展仿真实验,通过与经典的相关性模型以及整数编码字典进行比较,表明所提方法具有更加突出的故障检测与隔离能力。
With regard to the low fault recognition problem of traditional testability models, a analog circuit testability analysis and fault diagnosis method based on fault-pair Boolean table(FPBT) is proposed. Firstly, a novel testability model is created according to the characteristics of the FPBT, and the corresponding predicting method for the fault detection rate and fault isolation rate is studied. Then, the transformation from the real number field sample data to the FPBT is realized based on kernel density estimation, and the fault diagnosis and reasoning of measured data are implemented based on a "one-against-one" voting strategy. Finally, simulation experiments are performed on the Sallen-Key bandpass filter circuit. The results show that the proposed method is more prominent in fault detection and isolation after comparing it with traditional methods, including the dependency model and integer-coded dictionary.
With regard to the low fault recognition problem of traditional testability models, a analog circuit testability analysis and fault diagnosis method based on fault-pair Boolean table(FPBT) is proposed. Firstly, a novel testability model is created according to the characteristics of the FPBT, and the corresponding predicting method for the fault detection rate and fault isolation rate is studied. Then, the transformation from the real number field sample data to the FPBT is realized based on kernel density estimation, and the fault diagnosis and reasoning of measured data are implemented based on a "one-against-one" voting strategy. Finally, simulation experiments are performed on the Sallen-Key bandpass filter circuit. The results show that the proposed method is more prominent in fault detection and isolation after comparing it with traditional methods, including the dependency model and integer-coded dictionary.
引文
[1]张伟昆.测试性分析与评估体系的研究[J].国外电子测量技术,2015,34(5):38-42.
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[7]李睿峰,李文海,唐小峰,等.基于故障对布尔表的模拟电路测试性分析方法[J].中国测试,2017,43(3):19-23.
[8]YANG C L,TIAN S L,LONG B,et al.A novel test point selection method for analog fault dictionary techniques[J].Journal of Electronic Testing,2010,26(5):523-534.
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[10]TANG X F,XU A Q.Practical analog circuit diagnosis based on fault features with minimum ambiguities[J].Journal of Electronic Testing,2016,32(1):83-95.
[11]石君友.测试性设计分析与验证[M].北京:国防工业出版社,2011:87-96.
[12]JONES M C,MARRON J S,SHEATHER S J.A brief survey of bandwidth selection for density estimation[J].Journal of the American Statistical Association,1996,91(433):401-407.
[13]VASAN A S S,LONG B,PECHT M.Diagnostics and prognostics method for analog electronic circuits[J].IEEE Transactions on Industrial Electronics,2013,60(11):5277-5291.
[2]AO Y C,SHI Y B,ZHANG W,et al.An approximate calculation of ratio of normal variables and its application in analog circuit fault diagnosis[J].Journal of Electronic Testing,2013,29(4):555-565.
[3]BINU D,KARIYAPPA B S.A survey on fault diagnosis of analog circuits:taxonomy and state of the art[J].International Journal of Electronics and Communications,2017,73:68-83.
[4]杨鹏.基于相关性模型的诊断策略优化设计技术[D].长沙:国防科学技术大学,2008.
[5]GOLONEK T,RUTKOWSKI J.Genetic-algorithm-based method for optimal analog test points selection[J].IEEE Transactions on Circuits and Systems II:Express Briefs,2007,54(2):117-121.
[6]LEI H J,QIN K Y.A general method for analog test point selection using multi-frequency analysis[J].Analog Integrated Circuits and Signal Processing,2015,84(2):185-200.
[7]李睿峰,李文海,唐小峰,等.基于故障对布尔表的模拟电路测试性分析方法[J].中国测试,2017,43(3):19-23.
[8]YANG C L,TIAN S L,LONG B,et al.A novel test point selection method for analog fault dictionary techniques[J].Journal of Electronic Testing,2010,26(5):523-534.
[9]LUO H,WANG Y,LIN H,et al.A new optimal test node selection method for analog circuit[J].Journal of Electronic Testing,2012,28(3):279-290.
[10]TANG X F,XU A Q.Practical analog circuit diagnosis based on fault features with minimum ambiguities[J].Journal of Electronic Testing,2016,32(1):83-95.
[11]石君友.测试性设计分析与验证[M].北京:国防工业出版社,2011:87-96.
[12]JONES M C,MARRON J S,SHEATHER S J.A brief survey of bandwidth selection for density estimation[J].Journal of the American Statistical Association,1996,91(433):401-407.
[13]VASAN A S S,LONG B,PECHT M.Diagnostics and prognostics method for analog electronic circuits[J].IEEE Transactions on Industrial Electronics,2013,60(11):5277-5291.