化学包覆法制备Ho~(3+)掺杂钛酸钡基X8R细晶陶瓷
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  • 英文篇名:Preparation of Ho~(3+)-doped BaTiO_3 Based X8R Fine-grained Ceramics by Chemical Coating Method
  • 作者:黄咏安 ; 路标 ; 唐振华 ; 李丹丹 ; 姚英邦 ; 陶涛 ; 梁波 ; 鲁圣国
  • 英文作者:HUANG Yongan;LU Biao;TANG Zhenhua;LI Dandan;YAO Yingbang;TAO Tao;LIANG Bo;LU Shengguo;Guangdong Provincial Research Center on the Smart Materials and Energy Conversion Devices, Guangdong Provincial Key Laboratory of Functional Soft Condensed Matter, School of Materials and Energy, Guangdong University of Technology;
  • 关键词:化学包覆法 ; 氧化钬 ; 钛酸钡 ; 细晶陶瓷 ; “核-壳”结构
  • 英文关键词:chemical coating method;;holmium oxide;;barium titanate;;fine-grained ceramic;;core-shell structure
  • 中文刊名:GXYB
  • 英文刊名:Journal of the Chinese Ceramic Society
  • 机构:广东省智能材料和能量转化器件工程技术研究中心广东省软物质重点实验室广东工业大学材料与能源学院;
  • 出版日期:2017-07-27 18:08
  • 出版单位:硅酸盐学报
  • 年:2017
  • 期:v.45;No.342
  • 基金:国家自然科学基金委–广东省联合基金(U1501246);; 国家自然科学基金(51372042);; 广东省自然科学基金重大基础研究培育项目(2015A030308004)
  • 语种:中文;
  • 页:GXYB201709007
  • 页数:6
  • CN:09
  • ISSN:11-2310/TQ
  • 分类号:61-66
摘要
采用化学包覆法将Ho_2O_3包覆在纳米级钛酸钡粉体表面,通过烧结将Ho~(3+)扩散到钛酸钡晶粒中,调节其介电性能,研究了不同Ho~(3+)掺杂量对Ba Ti O3基陶瓷相组成、微观结构和介电性能的影响。X射线衍射和扫描电子显微镜分析结果表明:Ho~(3+)改性陶瓷样品均为赝立方相,Ho~(3+)的加入能抑制晶粒生长,改善陶瓷微观结构,有利于制备均匀的细晶陶瓷。透射电子显微镜观察显示,包覆层的厚度约为2 nm,包覆Ho_2O_3有助于陶瓷烧结过程中形成"核-壳"结构晶粒,能显著改善钛酸钡基陶瓷的介电温度稳定性,提高绝缘电阻。当Ho~(3+)掺杂量为2.0%时,陶瓷的相对介电常数为1 612,ΔC/C(-55~150℃)<±15%,满足EIA X8R电容器的温度特性。
        Ho_2O_3 was coated on the surface of nanosized barium titanate powder by a chemical coating method. Ho~(3+) ions were diffused into BaTiO_3 grains in a ceramic sintering process to adjust the dielectric properties. The effect of doped Ho~(3+) ionic content on the composition, microstructure and dielectric constant of ceramics at various temperatures were investigated. Based on the results by X-ray diffraction and scanning electron microscopy, Ho~(3+) ions-doped ceramics show a pseudo-cubic crystalline phase. The addition of Ho~(3+) ions can inhibit the grain growth, modify the microstructure, and form the homogeneous fine-grain structure. The results by transmisson electron microscopy indicate that the thickness of the coating layer is approximately 2 nm. The coating of Ho_2O_3 favors the formation of the core-shell grain structure during sintering, thus improving the temperature stability of dielectric constant, and enhancing the insulative resistance. The dielectric constant of is 1 612, ΔC/C(-50~150 ℃) <±15% at the Ho~(3+) ionic concentration of 2%, which meet the requirements of EIA X8 R for the temperature-dependent ceramic capacitors.
引文
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