摘要
采用化学包覆法将Ho_2O_3包覆在纳米级钛酸钡粉体表面,通过烧结将Ho~(3+)扩散到钛酸钡晶粒中,调节其介电性能,研究了不同Ho~(3+)掺杂量对Ba Ti O3基陶瓷相组成、微观结构和介电性能的影响。X射线衍射和扫描电子显微镜分析结果表明:Ho~(3+)改性陶瓷样品均为赝立方相,Ho~(3+)的加入能抑制晶粒生长,改善陶瓷微观结构,有利于制备均匀的细晶陶瓷。透射电子显微镜观察显示,包覆层的厚度约为2 nm,包覆Ho_2O_3有助于陶瓷烧结过程中形成"核-壳"结构晶粒,能显著改善钛酸钡基陶瓷的介电温度稳定性,提高绝缘电阻。当Ho~(3+)掺杂量为2.0%时,陶瓷的相对介电常数为1 612,ΔC/C(-55~150℃)<±15%,满足EIA X8R电容器的温度特性。
Ho_2O_3 was coated on the surface of nanosized barium titanate powder by a chemical coating method. Ho~(3+) ions were diffused into BaTiO_3 grains in a ceramic sintering process to adjust the dielectric properties. The effect of doped Ho~(3+) ionic content on the composition, microstructure and dielectric constant of ceramics at various temperatures were investigated. Based on the results by X-ray diffraction and scanning electron microscopy, Ho~(3+) ions-doped ceramics show a pseudo-cubic crystalline phase. The addition of Ho~(3+) ions can inhibit the grain growth, modify the microstructure, and form the homogeneous fine-grain structure. The results by transmisson electron microscopy indicate that the thickness of the coating layer is approximately 2 nm. The coating of Ho_2O_3 favors the formation of the core-shell grain structure during sintering, thus improving the temperature stability of dielectric constant, and enhancing the insulative resistance. The dielectric constant of is 1 612, ΔC/C(-50~150 ℃) <±15% at the Ho~(3+) ionic concentration of 2%, which meet the requirements of EIA X8 R for the temperature-dependent ceramic capacitors.
引文
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