光纤护套材料在变压器油中的电老化特性研究
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摘要
光纤在变压器在线监测方面具有很大的发展空间,本文对光纤护套材料进行了基于逐步升压法的电老化测试,并研究热老化对光纤护套材料电老化寿命的影响。与传统变压器中油浸绝缘纸的击穿电压进行了对比,发现ETFE、PTFE、PA12的击穿电压均优于油浸绝缘纸。在此基础上,利用双参数Weibull分布对ETFE材料和油浸绝缘纸的试验数据进行统计分析,用反幂函数和指数函数拟合试验数据并求得两者的电压耐受系数。结果表明:ETFE材料在反幂函数和指数函数两种模型上表现出的参数均优于油浸绝缘纸,电老化寿命较油浸绝缘纸有显著提高,说明以ETFE材料作为护套的光纤可以稳定运行在变压器中。
Optical fiber has great development space in on-line monitoring of transformer. In this paper,the optical fiber sheath material was conducted electrical ageing tests based on step by step method, and the effect of thermal ageing on its electrical ageing life was studied. It was found that the breakdown voltage of ETFE, PTFE, and PA12 is higher than that of oil-immersed insulating paper in traditional transformer. The test data of ETFE material and oil-immersed insulating paper were statistically analyzed using double parameters Weibull distribution and fitted by the inverse power function and exponential function, and their voltage tolerance coefficients were obtained. The results show that the parameters of ETFE in inverse power function and exponential function model are better than those of the oil-immersed insulating paper, and its electrical ageing life is significantly longer than that of the oil-immersed insulating paper, indicating that the optical fiber using ETFE material as sheath can be stably operated in transformer.
Optical fiber has great development space in on-line monitoring of transformer. In this paper,the optical fiber sheath material was conducted electrical ageing tests based on step by step method, and the effect of thermal ageing on its electrical ageing life was studied. It was found that the breakdown voltage of ETFE, PTFE, and PA12 is higher than that of oil-immersed insulating paper in traditional transformer. The test data of ETFE material and oil-immersed insulating paper were statistically analyzed using double parameters Weibull distribution and fitted by the inverse power function and exponential function, and their voltage tolerance coefficients were obtained. The results show that the parameters of ETFE in inverse power function and exponential function model are better than those of the oil-immersed insulating paper, and its electrical ageing life is significantly longer than that of the oil-immersed insulating paper, indicating that the optical fiber using ETFE material as sheath can be stably operated in transformer.
引文
[1]郑晴.基于光纤传感的变压器局部放电超声检测方法研究[D].北京:华北电力大学,2016.
[2]刘真良.油浸式变压器的铁芯损耗特征与光纤Bragg光栅在线监测研究[D].昆明:昆明理工大学,2016.
[3]李凯.变压器的振动状态分析与光纤光栅监测研究[D].昆明:昆明理工大学,2016.
[4]邓建钢,王立新,聂德鑫,等.内置光纤光栅油浸式变压器的研制[J].中国电机工程学报,2013,33(24):160-167.
[5]邓建钢,郭涛,徐秋元,等.变压器绕组测温光纤光栅传感器设计及性能测试[J].高电压技术,2012,38(6):1348-1355.
[6]奚红娟.变压器绕组温度分布光纤光栅在线监测及影响因素研究[D].重庆:重庆大学,2012.
[7]陈霄.基于光纤传感技术的油浸式电力变压器状态多参量在线检测研究[D].济南:山东大学,2012.
[8]宋璇坤,闫培丽,肖智宏,等.全光纤电流互感器技术应用评述[J].电力系统保护与控制,2016,44(8):149-154.
[9]江军,马国明,宋宏图,等.基于侧边抛磨光纤布拉格光栅的变压器油中溶解氢气传感器[J].电工技术学报,2017,32(13):264-270.
[10]陈强,李庆民,丛浩熹,等.基于多点分布式光纤光栅的GIS隔离开关触头温度在线监测技术[J].电工技术学报,2015,30(12):298-306.
[11]周延辉,赵振刚,李英娜,等.埋入35kV干式空心电抗器的光纤布拉格光栅测温研究[J].电工技术学报,2015,30(5):142-146.
[12]刘荣梅,梁大开,王妮,等.光纤力学性能的试验研究[J].实验力学,2007,22(1):79-84.
[13]CYGAN P,LAGHARI J R.Models for insulation aging under electrical and thermal multi-stress[J].IEEE Transactions on Electrical and Insulation,1990,25(5):923-934.
[14]李忠华,尹毅,朱军,等.聚合物绝缘电热联合老化的陷阱理论和实验验证[J].中国电机工程学报,1999,19(2):70-74.
[15]尹毅,肖登明,屠德民.空间电荷在评估绝缘聚合物电老化程度中的应用研究[J].中国电机工程学报,2002,22(1):43-48.
[16]尹毅,屠德民,李明,等.用等温电流法研究自由基清除剂的作用机理-聚合物电老化陷阱理论的实验验证[J].中国电机工程学报,2000,20(3):13-15.
[17]KHACHEN W,LAGHARI J R.Estimating lifetime of PP,PI and PVDF under artificial void conditions using step-stress tests[J].IEEE Transactions Dielectrics and Electrical and Insulation,1992,27(5):1022-1025.
[18]IEEE Standard Board.IEEE guide for the statistical analysis of electrical insulation voltage endurance data:IEEEStd 930TM-2004[S].New York:IEEE,2004.
[19]蒋雄伟,贾志东,谢恒.绝缘材料老化寿命模型的研究进展[J].高电压技术,2000,26(3):44-46.
[20]MONTANARI G C.Aging phenomenology and modeling[J].IEEE Transactions on Dielectrics and Electrical Insulation,1993,28(5):755-776.
[21]TANG L C.Analysis of step-stress accelerated-life-test data:a new approach[J].IEEE Transactions on Reliability,1996,45(1):69-74.
[22]LAUGHARI J R.A short method of estimating lifetime of polypropylenes film using step-stress tests[J].IEEE Transactions on Electrical Insulation,1990,25(6):1180-1182.
[23]International Electrotechnical Commission.Electrical strength of insulating materials test methods Part 1:Tests at power frequencies:IEC 60243-1:1998[S].Geneva,Swirtzerland:IEC,1998,
[24]MONTANARI G C.PD source recognition by Weibull processing of pulse height distributions[J].IEEE Transactions on Dielectrics and Electrical Insulation,2000,7(1):48-58.
[25]FABIANI D.Discussion on application of the Weibull distribution to electrical breakdown of insulating materials[J].IEEE Transactions on Dielectrics and Electrical Insulation,2005,12(1):11-16.
[26]CHEN G,DAVIES A E.The influence of defects on the short-term breakdown characteristics and long-term DC performance of LDPE insulation[J].IEEE Transactions on Dielectrics and Electrical Insulation,2000,7(3):401-407.
[27]DISSADO L,MAZZANTI G,MONTANARI G C.The incorporation of space charge degradation in the life model for electrical insulating materials[J].IEEE Transactions on Dielectrics and Electrical Insulation,1995,2(6):1147-1158.
[2]刘真良.油浸式变压器的铁芯损耗特征与光纤Bragg光栅在线监测研究[D].昆明:昆明理工大学,2016.
[3]李凯.变压器的振动状态分析与光纤光栅监测研究[D].昆明:昆明理工大学,2016.
[4]邓建钢,王立新,聂德鑫,等.内置光纤光栅油浸式变压器的研制[J].中国电机工程学报,2013,33(24):160-167.
[5]邓建钢,郭涛,徐秋元,等.变压器绕组测温光纤光栅传感器设计及性能测试[J].高电压技术,2012,38(6):1348-1355.
[6]奚红娟.变压器绕组温度分布光纤光栅在线监测及影响因素研究[D].重庆:重庆大学,2012.
[7]陈霄.基于光纤传感技术的油浸式电力变压器状态多参量在线检测研究[D].济南:山东大学,2012.
[8]宋璇坤,闫培丽,肖智宏,等.全光纤电流互感器技术应用评述[J].电力系统保护与控制,2016,44(8):149-154.
[9]江军,马国明,宋宏图,等.基于侧边抛磨光纤布拉格光栅的变压器油中溶解氢气传感器[J].电工技术学报,2017,32(13):264-270.
[10]陈强,李庆民,丛浩熹,等.基于多点分布式光纤光栅的GIS隔离开关触头温度在线监测技术[J].电工技术学报,2015,30(12):298-306.
[11]周延辉,赵振刚,李英娜,等.埋入35kV干式空心电抗器的光纤布拉格光栅测温研究[J].电工技术学报,2015,30(5):142-146.
[12]刘荣梅,梁大开,王妮,等.光纤力学性能的试验研究[J].实验力学,2007,22(1):79-84.
[13]CYGAN P,LAGHARI J R.Models for insulation aging under electrical and thermal multi-stress[J].IEEE Transactions on Electrical and Insulation,1990,25(5):923-934.
[14]李忠华,尹毅,朱军,等.聚合物绝缘电热联合老化的陷阱理论和实验验证[J].中国电机工程学报,1999,19(2):70-74.
[15]尹毅,肖登明,屠德民.空间电荷在评估绝缘聚合物电老化程度中的应用研究[J].中国电机工程学报,2002,22(1):43-48.
[16]尹毅,屠德民,李明,等.用等温电流法研究自由基清除剂的作用机理-聚合物电老化陷阱理论的实验验证[J].中国电机工程学报,2000,20(3):13-15.
[17]KHACHEN W,LAGHARI J R.Estimating lifetime of PP,PI and PVDF under artificial void conditions using step-stress tests[J].IEEE Transactions Dielectrics and Electrical and Insulation,1992,27(5):1022-1025.
[18]IEEE Standard Board.IEEE guide for the statistical analysis of electrical insulation voltage endurance data:IEEEStd 930TM-2004[S].New York:IEEE,2004.
[19]蒋雄伟,贾志东,谢恒.绝缘材料老化寿命模型的研究进展[J].高电压技术,2000,26(3):44-46.
[20]MONTANARI G C.Aging phenomenology and modeling[J].IEEE Transactions on Dielectrics and Electrical Insulation,1993,28(5):755-776.
[21]TANG L C.Analysis of step-stress accelerated-life-test data:a new approach[J].IEEE Transactions on Reliability,1996,45(1):69-74.
[22]LAUGHARI J R.A short method of estimating lifetime of polypropylenes film using step-stress tests[J].IEEE Transactions on Electrical Insulation,1990,25(6):1180-1182.
[23]International Electrotechnical Commission.Electrical strength of insulating materials test methods Part 1:Tests at power frequencies:IEC 60243-1:1998[S].Geneva,Swirtzerland:IEC,1998,
[24]MONTANARI G C.PD source recognition by Weibull processing of pulse height distributions[J].IEEE Transactions on Dielectrics and Electrical Insulation,2000,7(1):48-58.
[25]FABIANI D.Discussion on application of the Weibull distribution to electrical breakdown of insulating materials[J].IEEE Transactions on Dielectrics and Electrical Insulation,2005,12(1):11-16.
[26]CHEN G,DAVIES A E.The influence of defects on the short-term breakdown characteristics and long-term DC performance of LDPE insulation[J].IEEE Transactions on Dielectrics and Electrical Insulation,2000,7(3):401-407.
[27]DISSADO L,MAZZANTI G,MONTANARI G C.The incorporation of space charge degradation in the life model for electrical insulating materials[J].IEEE Transactions on Dielectrics and Electrical Insulation,1995,2(6):1147-1158.