基于良率改善的IC测试探针优化设计
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摘要
本论文改善设计一种弹力更大,材质更好,针头形状更佳的IC测试探针。传统的IC测试探针里面的弹簧弹力一般,针头采用镀金的材质,使用单锥形状的针头,针测次数少,使用寿命短,保养更换频繁,阻碍了生产率的提高。现通过提高弹簧弹力,使用钯合金的材质,采用三爪形状的针头可明显的增加针测次数,延长使用寿命,减少保养更换的频率,具有良好的经济性和可行性。
This paper design a high elasticity, better quality of material, better shape of plunger. Traditional IC pogo 针 have a normal elasticity, plunger use gold plated material, plunger use sharp shape;have low contact times, have low life time, have high socket offline clean frequency, block the production efficiency, now we use high elasticity spring, Pd alloy plunger, use 3 point crown, these can increase contact times, have long life time, have low socket offline clean frequency, and the additional pressure can be converted into a circular movement and the simple, reliable, can achieve a higher increase to more than a sound economic and practical.
This paper design a high elasticity, better quality of material, better shape of plunger. Traditional IC pogo 针 have a normal elasticity, plunger use gold plated material, plunger use sharp shape;have low contact times, have low life time, have high socket offline clean frequency, block the production efficiency, now we use high elasticity spring, Pd alloy plunger, use 3 point crown, these can increase contact times, have long life time, have low socket offline clean frequency, and the additional pressure can be converted into a circular movement and the simple, reliable, can achieve a higher increase to more than a sound economic and practical.
引文
[1]余玉芳主编.机电元件技术手册编委会.机电元件技术手册[M].北京:电子工业出版社,1992.
[2]邢洁.ESD荷电器件放电模式的测试条件研究[D].江苏苏州:苏州大学,2007.
[3]II JI卡兰塔罗夫,JI A采伊特林.电感计算手册[M].陈汤铭,刘保安,译.北京:机械工业出版社,1992:82-130.
[4]李晓惠.测试探针结构的技术发展[J].制造业自动化,2013,35(11):97-100.
[5]李海峰,刘晨,孙艳冬,申学良.Pogo pin系列弹针连接器的设计研究[J].机电元件,2016,36(4):6-8.
[2]邢洁.ESD荷电器件放电模式的测试条件研究[D].江苏苏州:苏州大学,2007.
[3]II JI卡兰塔罗夫,JI A采伊特林.电感计算手册[M].陈汤铭,刘保安,译.北京:机械工业出版社,1992:82-130.
[4]李晓惠.测试探针结构的技术发展[J].制造业自动化,2013,35(11):97-100.
[5]李海峰,刘晨,孙艳冬,申学良.Pogo pin系列弹针连接器的设计研究[J].机电元件,2016,36(4):6-8.