反幂定律应用于高压电缆寿命设计的研究进展
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摘要
本文回顾了反幂定律的发展过程,用Eyring公式对反幂定律的正确性进行了理论解释,总结了反幂定律在确定高压电缆绝缘厚度和在电缆E-t寿命曲线中的应用,给出了温度修正的电老化寿命模型,阐述了温度在高压电缆寿命设计中的重要性。
The development process of the inverse power law was reviewed, and the correctness of inverse power law was theoretical explained with the Eyring equation. The application of the inverse power law in determining the thickness of high voltage cable insulation and the application in the life curves of cable were summarized. Finally, this paper presented the electrical ageing lifetime model revised by temperature and emphasized the importance of temperature in the lifetime design of high voltage cable.
The development process of the inverse power law was reviewed, and the correctness of inverse power law was theoretical explained with the Eyring equation. The application of the inverse power law in determining the thickness of high voltage cable insulation and the application in the life curves of cable were summarized. Finally, this paper presented the electrical ageing lifetime model revised by temperature and emphasized the importance of temperature in the lifetime design of high voltage cable.
引文
[1]IEC/TS 61251—2008,Electrical Insulating Materials-A.C.Voltage Endurance Evaluation-Introduction[S].
[2]Dakin T W.Electrical Insulation Deterioration Treated as a Chemical Rate Phenomenon[J].Transactions of the American Institute of Electrical Engineers,1948,67(1):113-122.
[3]Dissado L A,Mazzanti G,Montanari G C.The Incorporation of Space Charge Degradation in the Life Model for Electrical Insulating Materials[J].IEEE Transactions on Dielectrics and Electrical Insulation,1995,2(6):1147-1158.
[4]Dissado L A,Mazzanti G,Montanari G C.The Role of Trapped Space Charges in the Electrical Aging of Insulating Materials[J].IEEE Transactions on Dielectrics and Electrical Insulation,1997,4(5):496-506.
[5]Peek F W.Dielectric Phenomena in High Voltage Engineering[M].New York:Mcgraw-hill Book Company,1915.
[6]Montsinger V M.Effects of Time and Frequency on Insulation Test of Transformers[J].Journal of the American Institute of Electrical Engineers,1924,43(2):145-155.
[7]Montsinger V M.Breakdown Curve for Solid Insulation[J].Journal of the American Institute of Electrical Engineers,1935,54(12):1300-1301.
[8]Starr W T.Progressive Stress-A New Accelerated Approach to Voltage Endurance[J].IEEE Transactions on Power Apparatus and Systems,1961,80(3):515-522.
[9]Mc Lean D A.Paper Capacitors Containing Chlorinated Impregnants[J].Industrial and Engineering Chemistry,1945,39(11):1457-1461.
[10]Endicott H,Hatch B,Sohmer R.Application of the Eyring Model to Capacitor Aging Data[J].IEEE Transactions on Component Parts,1965,12(1):34-41.
[11]Yoda B,Ikeda C,Sekii Y,et al.Development of 500k V Cross-Linked Polyethylene Insulated Power Cable[J].IEEE Transactions on Power Apparatus and Systems,1985,Per-(S):32-38.
[12]Oudin J M,Flamand C A.The Use of Thermoplastic Insulated Materials in the Manufacture of DC and AC Cables[C]//International Council on Large Electric Systems,1962:209.
[13]Kreuger F H.Endurance Tests with Polymeric Insulated Cables,Materials and Criteria[C]//International Council on Large Electric Systems,1963:21.
[14]Kubota T,Takahashi T,Sakuma S.Development of 500k V XLPE Cables and Accessories for Long Distance Underground Transmission Line[J].IEEE Transactions on Electrical Insulation,1994,9(4):1741-1749.
[15]Bahder G,Garrity T,Sosnowski M,et al.Physical Model of Electric Aging and Breakdown of Extruded Polymeric Insulated Power Cables[J].IEEE Transactions on Power Apparatus and Systems,1982,PAS-101(6):1379-1390.
[16]Liu Y,Cai X L.A Novel Method for the Insulation Thickness Design of HV XLPE Cable Based on Electrical Treeing Tests[J].IEEE Transactions on Dielectrics and Electrical Insulation,2014,21(4):1540-1546.
[17]Brancato E L.Insulation Aging a Historical and Critical Review[J].IEEE Transactions on Electrical Insulation,1978,13(4):308-317.
[18]Tzimas A,Rowland S,Dissado L A,et al.Effect of Long-time Electrical and Thermal Stresses upon the Endurance Capability of Cable Insulation Material[J].IEEE Transactions on Dielectrics and Electrical Insulation,2009,16(5):1436-1443.
[19]江裕熬,张百华,高乃奎,等.充油电缆纸绝缘老化中局部放电特性的研究[J].高电压技术,2006,32(7):54-57.
[20]金天雄,刘飞,江平开,等.热老化XLPE电缆绝缘的介电击穿行为的研究[J].电线电缆,2008(6):28-31.
[21]周韫捷,李红雷,王琦梦,等.加速热老化对XLPE电缆绝缘力学性能和介电性能的影响研究[J].华东电力,2014,42(8):1606-1610.
[22]徐俊,王晓东,欧阳本红,等.热老化对交联聚乙烯电缆绝缘理化结构的影响[J].绝缘材料,2013,46(2):33-37.
[23]Simoni L.General Equation of the Decline in the Electric Strength for Combined Thermal and Electrical Stresses[J].IEEE Transactions on Electrical Insulation,1984,19(1):45-52.
[24]Montanari G C,Cacciari M.A Probabilistic Life Model for Insulating Materials Showing Electrical Thresholds[J].IEEE Transactions on Electrical Insulation,1989,24(1):127-137.
[25]Dang C,Parpal J L,Crine J P.Electrical Aging of Extruded Dielectric Cables:Review of Existing Theories and Data[J].IEEE Transactions on Dielectrics and Electrical Insulation,1996,3(2):237-247.
[2]Dakin T W.Electrical Insulation Deterioration Treated as a Chemical Rate Phenomenon[J].Transactions of the American Institute of Electrical Engineers,1948,67(1):113-122.
[3]Dissado L A,Mazzanti G,Montanari G C.The Incorporation of Space Charge Degradation in the Life Model for Electrical Insulating Materials[J].IEEE Transactions on Dielectrics and Electrical Insulation,1995,2(6):1147-1158.
[4]Dissado L A,Mazzanti G,Montanari G C.The Role of Trapped Space Charges in the Electrical Aging of Insulating Materials[J].IEEE Transactions on Dielectrics and Electrical Insulation,1997,4(5):496-506.
[5]Peek F W.Dielectric Phenomena in High Voltage Engineering[M].New York:Mcgraw-hill Book Company,1915.
[6]Montsinger V M.Effects of Time and Frequency on Insulation Test of Transformers[J].Journal of the American Institute of Electrical Engineers,1924,43(2):145-155.
[7]Montsinger V M.Breakdown Curve for Solid Insulation[J].Journal of the American Institute of Electrical Engineers,1935,54(12):1300-1301.
[8]Starr W T.Progressive Stress-A New Accelerated Approach to Voltage Endurance[J].IEEE Transactions on Power Apparatus and Systems,1961,80(3):515-522.
[9]Mc Lean D A.Paper Capacitors Containing Chlorinated Impregnants[J].Industrial and Engineering Chemistry,1945,39(11):1457-1461.
[10]Endicott H,Hatch B,Sohmer R.Application of the Eyring Model to Capacitor Aging Data[J].IEEE Transactions on Component Parts,1965,12(1):34-41.
[11]Yoda B,Ikeda C,Sekii Y,et al.Development of 500k V Cross-Linked Polyethylene Insulated Power Cable[J].IEEE Transactions on Power Apparatus and Systems,1985,Per-(S):32-38.
[12]Oudin J M,Flamand C A.The Use of Thermoplastic Insulated Materials in the Manufacture of DC and AC Cables[C]//International Council on Large Electric Systems,1962:209.
[13]Kreuger F H.Endurance Tests with Polymeric Insulated Cables,Materials and Criteria[C]//International Council on Large Electric Systems,1963:21.
[14]Kubota T,Takahashi T,Sakuma S.Development of 500k V XLPE Cables and Accessories for Long Distance Underground Transmission Line[J].IEEE Transactions on Electrical Insulation,1994,9(4):1741-1749.
[15]Bahder G,Garrity T,Sosnowski M,et al.Physical Model of Electric Aging and Breakdown of Extruded Polymeric Insulated Power Cables[J].IEEE Transactions on Power Apparatus and Systems,1982,PAS-101(6):1379-1390.
[16]Liu Y,Cai X L.A Novel Method for the Insulation Thickness Design of HV XLPE Cable Based on Electrical Treeing Tests[J].IEEE Transactions on Dielectrics and Electrical Insulation,2014,21(4):1540-1546.
[17]Brancato E L.Insulation Aging a Historical and Critical Review[J].IEEE Transactions on Electrical Insulation,1978,13(4):308-317.
[18]Tzimas A,Rowland S,Dissado L A,et al.Effect of Long-time Electrical and Thermal Stresses upon the Endurance Capability of Cable Insulation Material[J].IEEE Transactions on Dielectrics and Electrical Insulation,2009,16(5):1436-1443.
[19]江裕熬,张百华,高乃奎,等.充油电缆纸绝缘老化中局部放电特性的研究[J].高电压技术,2006,32(7):54-57.
[20]金天雄,刘飞,江平开,等.热老化XLPE电缆绝缘的介电击穿行为的研究[J].电线电缆,2008(6):28-31.
[21]周韫捷,李红雷,王琦梦,等.加速热老化对XLPE电缆绝缘力学性能和介电性能的影响研究[J].华东电力,2014,42(8):1606-1610.
[22]徐俊,王晓东,欧阳本红,等.热老化对交联聚乙烯电缆绝缘理化结构的影响[J].绝缘材料,2013,46(2):33-37.
[23]Simoni L.General Equation of the Decline in the Electric Strength for Combined Thermal and Electrical Stresses[J].IEEE Transactions on Electrical Insulation,1984,19(1):45-52.
[24]Montanari G C,Cacciari M.A Probabilistic Life Model for Insulating Materials Showing Electrical Thresholds[J].IEEE Transactions on Electrical Insulation,1989,24(1):127-137.
[25]Dang C,Parpal J L,Crine J P.Electrical Aging of Extruded Dielectric Cables:Review of Existing Theories and Data[J].IEEE Transactions on Dielectrics and Electrical Insulation,1996,3(2):237-247.