基于全息光刻系统制备528nm周期孔阵图形
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  • 英文篇名:Preparation of 528 nm Periodic Hole Array Based on Holographic Lithography System
  • 作者:叶镇 ; 王勇 ; 高占琦 ; 刘丹丹 ; 庄允益 ; 张思源 ; 王晓华
  • 英文作者:Ye Zhen;Wang Yong;Gao Zhanqi;Liu Dandan;Zhuang Yunyi;Zhang Siyuan;Wang Xiaohua;National Key Lab on High Power Semiconductor Lasers,Changchun University of Science and Technology;
  • 关键词:光学制造 ; 全息光刻 ; 双曝光 ; 周期孔阵
  • 英文关键词:optical fabrication;;holographic lithography system;;double exposure;;periodic hole array
  • 中文刊名:JJZZ
  • 英文刊名:Chinese Journal of Lasers
  • 机构:长春理工大学高功率半导体激光国家重点实验室;
  • 出版日期:2015-08-10
  • 出版单位:中国激光
  • 年:2015
  • 期:v.42;No.464
  • 基金:国家自然科学基金(11474036)
  • 语种:中文;
  • 页:JJZZ201508043
  • 页数:5
  • CN:08
  • ISSN:31-1339/TN
  • 分类号:296-300
摘要
基于Ga As衬底采用全息光刻和湿法刻蚀技术制备周期孔阵图形。得出全息光刻双曝光最优曝光时间为60 s。采用H3PO4∶H202∶H2O=1∶1∶10配比的刻蚀液,得出最佳刻蚀时间为30 s。扫描电子显微镜(SEM)和原子力显微镜(AFM)测试图片显示,孔阵周期为528 nm,刻蚀深度为124 nm,具有完美的表面形貌及良好均匀性和周期性。
        The periodic hole array is fabricated on Ga As substrate by holographic lithography and wet etching. The double exposure in holographic lithography is adopted with optimized exposure time of 60 s. Wet etching solution with 1∶1∶10 volume ratio of H3PO4, H2O2 and H2O is adopted to etch the hole array for 30 s. Images of scanning electron microscopy(SEM) and atomic force microscopy(AFM) show that the hole array has a period of 528 nm,etching depth of 124 nm, with perfect surface morphology, good fringe continuity and uniformity.
引文
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