基于GJB/Z 299C的智能电能表关键元器件可靠性预计
详细信息    查看全文 | 推荐本文 |
  • 英文篇名:Reliability prediction of the key components for smart meter based on GJB/Z 299C
  • 作者:李蕊 ; 羡慧竹 ; 韩柳 ; 宋玮琼 ; 陆翔宇 ; 张加
  • 英文作者:Li Rui;Xian Huizhu;Han Liu;Song Weiqiong;Lu Xiangyu;Zhang Jiahai;State Grid Beijing Electric Power Research Institute;Yantai Dongfang Wisdom Electric Co.,Ltd.;
  • 关键词:智能电能表 ; 关键元器件 ; 可靠性预计
  • 英文关键词:smart meter;;key component;;reliability prediction
  • 中文刊名:DCYQ
  • 英文刊名:Electrical Measurement & Instrumentation
  • 机构:国网北京市电力科学研究院;烟台东方威思顿电气有限公司;
  • 出版日期:2019-01-15 09:56
  • 出版单位:电测与
  • 年:2019
  • 期:v.56;No.705
  • 语种:中文;
  • 页:DCYQ201904024
  • 页数:6
  • CN:04
  • ISSN:23-1202/TH
  • 分类号:153-158
摘要
针对国产智能电能表存在的一些问题,提出对智能电能表关键元器件进行可靠性预计,同时以GJB/Z 299C为基础,设计了关键元器件可靠性信息输入表。研究了智能电能表的主要故障类型,对各主要故障类型进行统计分析,给出了导致故障的关键元器件;基于GJB/Z 299C,设计出各关键元器件的可靠性信息输入表,通过填入相关数据信息,再进行相关计算,即可获得各关键元器件的工作失效率。该方法简单易行,已在企业中实行,对提高国产智能电能表可靠性具有一定的现实意义。
        Aming at some of the existing problems in domestic smart meter,this paper proposed to predict the reliability of the key components for smart meter,and designed input tables of reliability information for key components. The major type of faults of smart meter is discussed and analyzed,and finally,the most common key component of failure is given.Input table of reliability information for each key component is designed based on GJB/Z 299C,and working failure rate of each key component is obtained by calculating the relevant data information in the table. This method has been taken to the implement and has a certain practical significance because of its easiness and simplicity.
引文
[1]杨洪旗,刘少卿,黄进永.智能电能表的可靠性预计方法研究[J].电子产品可靠性与环境试验,2016,34(3):65-71.
    [2]范小飞,王波,于浩,等.电子式电能表可靠性分析及质量保障体系的建立[J].电测与表,2015,52(18):118-122.
    [3]依溥治,徐人恒,张明远,等.基于云平台的电能表可靠性预计系统设计与实现[J].电测与表,2017,54(5):96-100.
    [4]于海燕.电子元器件标准化应用管理[J].电子科学技术,2015,2(3):372-378.
    [5]中国人民解放军总装备部电子信息基础部.电子装备可靠性预计手册:GJB/Z 299C-2006[S].北京:总装备部军标出版发行部,2007.
    [6]International Electrotechnicai Commission.IEC-TR-62380-2004 Reliability data handbook universal model for reliability prediction of electronics components,PCBs and equipmpment[S].New York,USA:[s.n.],2006.
    [7]Airbus France.FIDES-Guide 2004 Issue A:reliability meth-odology for electronic systems[S].Doetinchem,Netherlands:FIDES Groud,2003.
    [8]FOUCHER B,BOULLIE J,MESLET B,et al.A review of reliability prediction methods for electronnic devices[J].Microelectronics Reliability,2002,(42):1155-1162.
    [9]曹冉,陈颖,康锐.基于Bellcore标准的电子产品可靠性预计方法及案例研究[J].电子质量,2010,(6):61-62.
    [10]European Power Supply Manufacturers Association.Rli-ability uidelies to understanding reliability predictio[R].wellingbo rough:EPSMA,2005.
    [11]王思彤,罗玮,袁瑞铭,等.电子式电能表寿命概念的探讨[J].电测与表,2009,46(10):48-52.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700