摘要
在芯片生产过程中,由于工艺的影响,带隙基准电压V_(BG)会存在偏差。在芯片测试阶段,需要对V_(BG)进行trim修调,使其满足芯片参数要求。简要分析了带隙基准电压误差的来源,提出了一种E-Fuse修调电路,通过程序中的代码控制修调电阻的大小,使V_(BG)满足要求。同时,在该修调电路的基础上,采用了一种新型算法,使得测试芯片V_(BG)的时间缩短了近558 ms,减少了测试时间,降低了测试成本。
In the process of chip production, bandgap reference voltage V_(BG)will produce deviation due to the influence of process. In the chip test phase, the V_(BG) was trimmed to meet the requirements of chip parameters. The deviation of bandgap reference voltage was analyzed briefly and a E-Fuse trim circuit was proposed. The size of resistance tolerance was controlled by the procedure of code, making V_(BG)meet requirements. At the same time, using a new algorithm on the basis of this trim circuit, the time of testing chip′s V_(BG)decreases nearly 558 ms, reducing test time and test cost.
引文
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