DSP处理器单粒子翻转率测试系统的研制
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摘要
航天器及其内部元器件在太空中会受到单粒子效应(SEE)带来的威胁,因此航天用电子器件在装备前必须进行抗SEE能力的测试评估。针对传统测试方法存在的测试系统程序容易在辐照过程崩溃、统计翻转数不准确、单粒子闩锁(SEL)辨别不清晰和忽略内核翻转统计等问题,设计了一种测试系统,通过片外加载与运行程序从而减少因辐照导致片内程序异常的现象;通过片外主控电路统计被测电路翻转数使统计翻转结果准确;通过主控电路控制被测电路时钟供给排除因频率增加导致电流过大而误判发生SEL的情况;通过内核指令集统计内核翻转数。实验结果表明,该测试系统可以实时全面地监测数字信号处理器(DSP)的SEE,并有效防止辐照实验器件(DUT)因SEL而失效。
Spacecrafts and their internal components will be threatened by single event effect(SEE) in space.Therefore aerospace electronic devices must be tested and evaluated for their ability resisting SEE before equipped.The test system programs for traditional test methods are easy to collapse in the irradiation process,inaccurate statistical flip counts,single event latchup(SEL) in discrepancies,and neglect of kernel flip statistics.A test system was designed to reduce the phenomenon of on-chip program exceptions caused by irradiation by loading and running programs off-chip.Flips of the circuit under test are counted by an off-chip main control circuit to make the statistical result accurate.Controlling the clock signal of the circuit under test by the main control circuit to eliminate the misjudgment of SEL due to excessive current caused by the increase of frequency.Counting kernel flips through a kernel instruction set.The results show that the test system provides comprehensive real-time monitoring of the single-particle effects of digital signal processors(DSP) and prevents the device under test(DUT) from fail due to SEL effectively.
Spacecrafts and their internal components will be threatened by single event effect(SEE) in space.Therefore aerospace electronic devices must be tested and evaluated for their ability resisting SEE before equipped.The test system programs for traditional test methods are easy to collapse in the irradiation process,inaccurate statistical flip counts,single event latchup(SEL) in discrepancies,and neglect of kernel flip statistics.A test system was designed to reduce the phenomenon of on-chip program exceptions caused by irradiation by loading and running programs off-chip.Flips of the circuit under test are counted by an off-chip main control circuit to make the statistical result accurate.Controlling the clock signal of the circuit under test by the main control circuit to eliminate the misjudgment of SEL due to excessive current caused by the increase of frequency.Counting kernel flips through a kernel instruction set.The results show that the test system provides comprehensive real-time monitoring of the single-particle effects of digital signal processors(DSP) and prevents the device under test(DUT) from fail due to SEL effectively.
引文
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