基于步进应力加速试验的某电子部件寿命评估
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  • 英文篇名:Life Assessment of an Electronic Component Based on Step Stress Accelerated Test
  • 作者:陈愿
  • 英文作者:CHEN Yuan;The 38th Research Institute of China Electronics Technology Group Corporation;
  • 关键词:电子部件 ; 步进应力 ; 加速寿命试验 ; 威布尔分布
  • 英文关键词:Timing censoring;;Step stress;;Accelerated life test;;Weibull distribution
  • 中文刊名:DYXU
  • 英文刊名:Electronic Component and Information Technology
  • 机构:中国电子科技集团公司第三十八研究所;
  • 出版日期:2019-02-20
  • 出版单位:电子元器件与信息技术
  • 年:2019
  • 期:No.20
  • 语种:中文;
  • 页:DYXU201902001
  • 页数:5
  • CN:02
  • ISSN:10-1509/TN
  • 分类号:5-9
摘要
针对电子高可靠性、长寿命的特点,提出了使用步进应力加速寿命试验方法来评估电子部件件的贮存寿命和可靠性指标。基于威布尔寿命分布和Arrhenius加速寿命模型,采用极大似然法进行参数估计,对电子部件在常温下(25℃)的贮存寿命进行评估。结果表明,在25℃下且可靠度为0.995时,使用步进应力加速寿命试验方法评估电子部件的寿命约为16.22年,与恒定应力下的加速寿命试验得出的结果相近,充分说明了采用步进应力加速寿命方法评估电子部件的有效性。
        Aiming at evaluating the storage life of electronic components with the characteristics of high reliability and long life, a timing censored step stress accelerated life test method is proposed. The Weibull distribution accelerated life model was established, and the maximum likelihood method was used to estimate the parameters. The storage life of the electronic components at normal temperature was obtained according to Arrhenius model and the above parameters. The results indicated that the life of the electronic component is estimated to be 16.22 years at 25°C when the reliability is 0.995, using the time-staggered step stress accelerated life test method, which is not much different from the evaluation life result under constant stress, this verifies the effectiveness of using the step stress accelerated life method to evaluate the life of electronic components.
引文
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