超B类感应电流快速释放装置冷态介质恢复特性计算及分析
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  • 英文篇名:Calculations and Analysis on Cold State Dielectric Recovery Characteristic in Super Class B Induced Current High Speed Release Device
  • 作者:刘振祥 ; 徐建源 ; 谭盛武 ; 孙英杰 ; 林莘 ; 张佳 ; 赵旭
  • 英文作者:LIU Zhenxiang;XU Jianyuan;TAN Shengwu;SUN Yingjie;LIN Xin;ZHANG Jia;ZHAO Xu;School of Electrical Engineering,Shenyang University of Technology;Pinggao Group Co.,Ltd.;
  • 关键词:超B类感应电流快速释放装置 ; 介质恢复特性 ; 气流场 ; 电场
  • 英文关键词:super class B induced current high speed release device;;dielectric recovery characteristic;;airflow field;;electric field
  • 中文刊名:GYDQ
  • 英文刊名:High Voltage Apparatus
  • 机构:沈阳工业大学电气工程学院;平高集团有限公司;
  • 出版日期:2018-07-16
  • 出版单位:高压电器
  • 年:2018
  • 期:v.54;No.352
  • 基金:国网平高集团有限公司科技项目(2016-045)~~
  • 语种:中文;
  • 页:GYDQ201807037
  • 页数:6
  • CN:07
  • ISSN:61-1127/TM
  • 分类号:258-263
摘要
针对超B类感应电流快速释放装置开断过程冷态介质恢复特性进行数值计算及分析。计算开断过程中气室内电场强度和SF6介质密度,依据流注理论,得到触头间临界击穿电压曲线,通过介质临界击穿电压与瞬态恢复电压(TRV)的对比,验证是否满足该快速释放装置冷态开断能力的要求。计算结果表明:动触头到达分闸点之后,气室内SF6介质密度基本保持不变,维持在27 kg/m3左右,而场强随开距的变化较明显,因此,电恢复过程是影响介质恢复特性的主要因素;超B类感应电流快速释放装置在冷态开断过程中,开距小于25 mm时临界击穿电压值小于TRV值,说明在此开距范围内,重击穿的可能性极大。
        The dielectric recovery characteristics on cold state during interrupting course of super class B inducedcurrent high speed release device are studied by numerical calculations and analyses. The dynamic changes of elec-tric field intensity and the density of SF6 in gas chamber during interrupting course are calculated. Critical break-down voltage curve could be obtained based on the stream theory. By comparing the critical breakdown voltage andthe transient recovery voltage(TRV),to verify whether it meets the requirements of the cold state breaking ability ofthe high speed release device. The results show that:the density of SF6 in gas chamber is basically unchanged,whichremains at about 27 kg/m3,while the electric field intensity is obviously changed with opening range. Therefore,thedielectric strength recovery process is the main factor affecting the dielectric recovery characteristics. When superclass B induced current high speed release device in the cold state breaking process,the critical breakdown voltageis less than the TRV value with the opening range less than 25 mm,indicating that when the opening distance is inthis range,the possibility of restrike is very great.
引文
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