摘要
芯片产业化过程中,涉及到大量探针卡的应用,探针卡对芯片测试非常重要;根据不同的标准对探针及探针卡进行分类;针对不同应用环境,分析了探针卡的选取方法;最后给出了探针卡的存放和使用相关规范,对探针卡的设计、加工及芯片的中测测试应用具有一定的参考作用。
Probe card is widely used in chip industrialization, It is very important for the chip testing; In this paper,the probe and probe card are classified according to different standards; The selection method of probe card is analyzed according to different application environment; Finally, the relevant rules for the storage and use about probe card are given. This paper has reference function for the design, manufacture and test of probe card.
引文
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