超构材料红外探测芯片的研究进展
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  • 英文篇名:Research Advances in Metamaterial Infrared Detectors
  • 作者:易飞
  • 英文作者:YI Fei;School of Optical and Electronic Information,Huazhong University of Science and Technology;
  • 关键词:超构材料 ; 红外探测芯片 ; 双色成像 ; 偏振成像 ; 高光谱成像
  • 英文关键词:metamaterials;;infrared detectors;;dual-band imaging;;polarization imaging;;hyperspectral imaging
  • 中文刊名:FKTC
  • 英文刊名:Flight Control & Detection
  • 机构:华中科技大学光学与电子信息学院;
  • 出版日期:2019-05-25
  • 出版单位:飞控与探测
  • 年:2019
  • 期:v.2;No.006
  • 基金:国家自然科学基金面上项目(11774112)
  • 语种:中文;
  • 页:FKTC201903002
  • 页数:28
  • CN:03
  • ISSN:10-1567/TJ
  • 分类号:14-41
摘要
在梳理超构材料的概念与发展历程的基础上,着重分析了超构材料对波长、偏振态、相位等电磁波参量的调控作用。结合红外探测芯片及成像系统的发展趋势,介绍了超构材料与红外探测芯片的结合,及其在双色/多色成像、偏振成像、高光谱成像等先进成像模式中的应用,以及国内外相关研究进展。
        This article reviews the concepts and progresses in the area of metamaterials with the special attention directed to the manipulation of electromagnetic wave parameters such as wavelength,polarization state,and phase using metamaterials.After introducing the trends in infrared detectors and imaging systems,the research on advances in merging metamaterials with infrared imaging detectors towards advanced imaging modalities such as dual-band/multi-band imaging,polarization imaging and hyperspectral imaging has been discussed.
引文
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