基于双向搜索与改进贪婪算法的测试点优选研究
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  • 英文篇名:Research on Optimal Selection of Test Points based on Bidirectional Search and Improved Greedy algorithm
  • 作者:庄小叶 ; 李轲
  • 英文作者:Zhuang Xiaoye;Li Ke;Department of Information Engineering, Weifang Engineering Vocational College;Department of Operational Support, Officer School of Rocket Army;
  • 关键词:测试点优选 ; 双向搜索 ; 特征信息熵 ; 动态贪婪
  • 英文关键词:Optimal selection of test points;;Bidirectional search;;Characteristic information entropy;;Dynamic greed
  • 中文刊名:BSSZ
  • 英文刊名:Journal of Baoshan University
  • 机构:潍坊工程职业学院信息工程系;火箭军士官学校作战保障系;
  • 出版日期:2019-04-15
  • 出版单位:保山学院学报
  • 年:2019
  • 期:v.38;No.161
  • 语种:中文;
  • 页:BSSZ201902014
  • 页数:4
  • CN:02
  • ISSN:53-1215/Z
  • 分类号:67-70
摘要
作为计算机科学与技术的典型应用领域,测试点的优选技术是测试性设计的关键;在对测试性模型相关性关系分析的基础上,针对不同的测试需求,在提出了相应的优化方法:对于完成基本功能的开机测试,提出了基于双向搜索的测试点优选算法;对于系统级诊断测试,提出了基于改进动态贪婪算法的测试点优选算法;根据不同的应用对象使用相应的算法,减少了影响因素,加强了算法针对性,能够有效的提高测试点选取速率,降低测试成本。
        As a typical application field of computer science and technology, the optimization of test points is the key to testability design. ased on the analysis of the correlation relationship of testability model, according to different test requirements, the corresponding optimization method is put forward. For the boot test of basic functions, a test point optimization algorithm based on bidirectional search is proposed. For system-level diagnostic testing, a test point optimization algorithm based on improved dynamic greed algorithm is proposed. Using the corresponding algorithms according to different application objects reduces the influence factors and strengthens the pertinence of the algorithm, which can effectively improve the selection rate of test points and reduce the test cost.
引文
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