金刚石线锯电解磨削切割多晶硅片的试验研究
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  • 英文篇名:Experimental Study on Electrochemical Grinding Machining of Polycrystalline Silicon Wafer with Diamond Wire Saw
  • 作者:鲍官培 ; 汪炜 ; 曹祥威
  • 英文作者:Bao Guanpei;Wang Wei;Cao Xiangwei;College of Mechanical and Electrical Engineering,Nanjing University of Aeronautics and Astronautics;
  • 关键词:金刚石线锯 ; 电解 ; 磨削 ; 多晶硅片 ; 制绒
  • 英文关键词:diamond wire saw;;electrochemical;;grinding;;polycrystalline silicon wafer;;texturization
  • 中文刊名:DJGU
  • 英文刊名:Electromachining & Mould
  • 机构:南京航空航天大学机电学院;
  • 出版日期:2016-12-20
  • 出版单位:电加工与模具
  • 年:2016
  • 期:No.329
  • 基金:国家自然科学基金资助项目(51175259)
  • 语种:中文;
  • 页:DJGU201606009
  • 页数:4
  • CN:06
  • ISSN:32-1589/TH
  • 分类号:44-46+51
摘要
基于金刚石线锯切割系统,开展了金刚线电解磨削切割多晶硅片试验。结果表明:电解磨削复合加工方法在机械磨削的同时复合了阳极氧化和腐蚀,在硅片表面产生了机械损伤缺陷和电化学腐蚀缺陷。酸制绒时腐蚀反应在两种类型缺陷处顺利进行,形成均匀致密的绒面结构,有效降低硅片表面反射率,有利于后续电池片光电转换效率的提高。
        The polycrystalline silicon wafers were sliced by electrochemical grinding method based on the diamond wire saw system. The electrochemical grinding experimental results show that the etching happens at the defects that caused by grinding and electrochemical reaction during the process of texturing. And the uniform and dense microstructure was formed on the surface of polycrystalline silicon wafer by acid wet texturing. The microstructure can reduce the surface reflectivity effectively and is better for the improvement of photoelectric conversion efficiency for cells.
引文
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