摘要
采用水热法以偏钒酸铵和硝酸制备水合五氧化二钒(V_2O_5·nH_2O)纳米带,采用场发射扫描电子显微镜(FE-SEM)、透射电子显微镜(TEM)、X射线粉末衍射分析仪(XRD)及拉曼光谱分析仪(Raman Spectra)对产物进行表征,采用半导体特性分析仪测试以产物为沟道的场效应器件性能。结果表明:制得的V_2O_5·nH_2O纳米带宽100~150nm,厚约20nm,含水量n在0.5~1之间,具有类晶结构;器件具有N型负微分电阻(N-NDR)效应,与V_2O_5·nH_2O的双载流子导电及Poole-Frenkel发射相关。栅压为0~9V时,开关电压随栅压增大而升高,峰谷电流比变化小,期间,栅压为1V时电压跨度最大为0.61V。
Hydrated vanadium pentoxide(V_2O_5·nH_2O)nanobelts were prepared by hydrothermal synthesis with NH_4VO_3 and HNO_3.The products were characterized by field emission scanning electron microscopy(FE-SEM),transmission electron microscopy(TEM),X-ray powder diffraction(XRD)and Raman spectra.Semiconductor characterization system was employed to test the performance of field effect transistor device which worked as channel.The results showed that the as-prepared V_2O_5·nH_2O nanobelts had a width around 100~150 nm,the thick was about 20 nm,the water content‘n'was in the range of 0.5~1,and crystal-like structure were demonstrated.The device exhibited N-type negative differential resistance(N-NDR)characteristic.The performance was related with ambipolar transportation and Poole-Frenkel emission of V_2O_5·nH_2O.While the gate voltage rising within 0~9 V,the switching voltages ascended and the peak-valley current ratios varied slightly,during that,the voltage spans peaked at 0.61 V when the gate voltage was 1 V.
引文
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