摘要
对比电子设备用固定电容器标准IEC 60384-1:2016与GB/T 2693-2001,分析两者在稳态湿热试验、加速稳态湿热试验的试验条件、试验方法等方面的主要差异,重点阐述了新增项目晶(锡)须生长的危害及试验方案,为修订GB/T 2693-2001提供支撑。
By comparing standard IEC 60384-1:2016 and GB/T 2693-2001 of fixed capacitors for use in electronic equipment, the main differences in test conditions, test methods and other aspects of steady-state and accelerated steadystate wet-heat test are analyzed, and the hazards of crystal(tin) whiskers growth and test schemes of new projects are emphatically expounded, which will provide support for the revision of GB/T 2693-2001.
引文
[1]李舒平. GB/T 2693-2001电子设备用固定电容器第1部分:总规范[S].北京:中国标准出版社,2001.
[2]IEC. IEC 60384-1:2016 Fixed capacitors for use in electronic equipment-Part 1:Generic specification[S]. Genera:IEC, 2016.
[3]姜东升,张沛,刘震.航天电子产品金属晶须形成机理、危害及抑制措施分析[J].导航与控制,2015(1):27-31.
[4]王先锋,贺岩峰.锡须生长机理的研究进展[J].电镀与涂饰, 2005(8):49-51.