基于概率模型检测的移动应用缺陷评估
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摘要
为研究移动应用缺陷发生概率对应用缺陷的修复选择、应用程序质量评估的影响,提出一种基于概率模型检测的移动应用程序缺陷评估研究方法。生成移动应用程序的回调序列概率模型,将该模型转换为离散时间链的Markov模型,采用概率模型检测器PRISM计算移动应用缺陷的发生概率,通过统计分析和对比实验分析研究方法的可行性和有效性。
To study the influence of the probability of the defect occurrence on the repair of application defect and the evaluation of the application quality,a method for evaluating the defect of mobile application based on the probabilistic model detection was proposed.A callback sequence probability model of mobile application was generated,and the model was transformed into a discrete time-chain Markov model.The probabilistic model detector PRISM was used to calculate the probability of mobile application defects.The feasibility and validity of the method were analyzed by statistical analysis and comparative experiments.
To study the influence of the probability of the defect occurrence on the repair of application defect and the evaluation of the application quality,a method for evaluating the defect of mobile application based on the probabilistic model detection was proposed.A callback sequence probability model of mobile application was generated,and the model was transformed into a discrete time-chain Markov model.The probabilistic model detector PRISM was used to calculate the probability of mobile application defects.The feasibility and validity of the method were analyzed by statistical analysis and comparative experiments.
引文
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[2]Wu T,Liu J,Xu Z,et al.Light-weight,inter-procedural and callback-aware resource leak detection for android apps[J].IEEE Transactions on Software Engineering,2016,42(11):1054-1076.
[3]Guo C,Zhang J,Yan J,et al.Characterizing and detecting resource leaks in Android applications[C]//IEEE/ACM 28th International Conference on Proceedings of the Automated Software Engineering,2013:389-398.
[4]Zhang H,Wu H,Rountev A.Automated test generation for detection of leaks in Android applications[C]//Proceedings of the 11th International Workshop on Automation of Software Test.ACM,2016:64-70.
[5]Shahriar H,North S,Mawangi E.Testing of memory leak in android applications[C]//IEEE 15th International Symposium on High-Assurance Systems Engineering.2014:176-183.
[6]Hsiao CH,Yu J,Narayanasamy S,et al.Race detection for event-driven mobile applications[J].Acm Sigplan Notices,2014,49(6):326-336.
[7]Ibing A.Efficient data-race detection with dynamic symbolic execution[C]//Computer Science and Information Systems.IEEE,2016:1719-1726.
[8]Bielik P,Raychev V,Vechev M.Scalable race detection for Android applications[C]//ACM Sigplan International Conference on Object-Oriented Programming,Systems,Languages,and Applications,2015:332-348.
[9]Hsiao CH,Yu J,Narayanasamy S,et al.Race detection for event-driven mobile applications[C]//In Proceedings of the35th ACM SIGPLAN Conference on Programming Language Design and Implementation,2014:326-336.
[10]Maiya P,Kanade A,Majumdar R.Race detection for android applications[C]//Proceedings of the 35th ACM SIGP-LAN Conference on Programming Language Design and Implementation,2014:316-325.
[11]Safi G,Shahbazian A,Halfond WGJ,et al.Detecting event anomalies in event-based systems[C]//Joint Meeting on Foundations of Software Engineering.ACM,2015:25-37.
[12]ZHENG Huimeng,LIU Weidong,XIAO Chengdi,et al.Assessment of hardware product design defects using Bayesian networks[J].Computer Engineering&Applications,2016,52(19):228-233(in Chinese).[郑慧萌,刘卫东,肖承地,等.基于贝叶斯网络的硬件产品设计缺陷评估[J].计算机工程与应用,2016,52(19):228-233.]
[13]LU Zhengfa,XU Ling,ZHANG Xiaohong,et al.An unsupervised defect prediction method based on probability[J].Computer Engineering and Science,2017,39(5):904-911(in Chinese).[陆正发,徐玲,张小洪,等.基于概率的无监督缺陷预测方法[J].计算机工程与科学,2017,39(5):904-911.]
[14]Kwiatkowska M,Norman G,Parker D.PRISM 4.0:Verification of probabilistic real-time systems[C]//Computer Aided Verification-International Conference,2011:585-591.
[15]Arzt S,Rasthofer S,Fritz C,et al.FlowDroid:Precise context,flow,field,object-sensitive and lifecycle-aware taint analysis for Android apps[C]//ACM Sigplan Conference on Programming Language Design and Implementation,2014:259-269.