摘要
解决老化筛选试验设备在元器件的极限电压、极限电流和非常温(-55℃~80℃)的条件下进行而校准无法实时进行的问题,本文提出了老化筛选试验设备的一种校准解决方案,设计了数据采集单元、处理单元和传输单元的老化筛选试验装置校准系统,可满足在老化筛选试验状态下完成对老化设备的校准。保证了老化筛选试验装置的量值准确。
In order to solve the problem that the aging screening test device can not be carried out in real time under the conditions of the limit voltage,limit current and unusual temperature(-55°C ~ 80°C) of the components,this thesis proposes a kind of calibration solution for aging screening test device. We designed the calibration system for the aging screening test device with data acquisition unit,processing unit and transmission unit,which can meet the requirements of calibration for the aging screening device in the aging screening test mode,and which can ensure the accuracy of the aging screening test device.
引文
[1]梁艺凡.电子元件的老化与筛选,光谱实验室[J],2013,2:865~867.
[2]胡俊达.电子元器件的选用和老化方法的讨论[J],电子质量,2003,24(11):7~16.
[3]王酣.集成电路高温动态老化系统校准方法研究[J],仪器仪表学报.2008,4:771~774.