高世代线TFT-LCD面板对盒精度的提升
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  • 英文篇名:Ass'y margin improvement of high-generation line's TFT-LCD panel
  • 作者:汪栋 ; 袁剑峰 ; 吴洪江 ; 刘正 ; 齐鹏煜 ; 陈维涛
  • 英文作者:WANG Dong;YUAN Jian-feng;WU Hong-jiang;LIU Zheng;QI Peng-yu;CHEN Wei-tao;Beijing BOE Display Technology Co.,Ltd.;
  • 关键词:TFT-LCD面板 ; 对盒精度 ; 阵列 ; 彩膜 ; 成盒 ; 真空对盒 ; 关键位置精度非线性补证 ; 封框胶
  • 英文关键词:TFT-LCD panel;;Ass'y margin;;array;;CF;;cell;;vacuum assembly system(VAS);;total pitch non-linear offset;;sealant
  • 中文刊名:YJYS
  • 英文刊名:Chinese Journal of Liquid Crystals and Displays
  • 机构:北京京东方显示技术有限公司;
  • 出版日期:2019-02-15
  • 出版单位:液晶与显示
  • 年:2019
  • 期:v.34
  • 语种:中文;
  • 页:YJYS201902004
  • 页数:10
  • CN:02
  • ISSN:22-1259/O4
  • 分类号:21-30
摘要
对盒精度提升是高世代TFT-LCD面板生产线产品小型化、薄型化、高PPI(300+)与高开口率升级的必备核心技术。通过阵列(Array)与彩膜(CF)关键位置/尺寸匹配性优化与离散性优化,首次尝试阵列关键位置精度(TP)非线性补正功能,并钻研成盒(Cell)过程中基板翻转稳定化、封框胶设计与涂布工艺优化,实现电视机、显示器、笔记本、平板电脑等产品对盒精度由7.5μm降低至5.5μm;在解决显示器产品按压Mura与平板电脑产品像素漏光的同时,对产品开口率的贡献也随着产品PPI的升高而增加,PPI 300+产品的开口率余量提高14.8%,有效提升了高世代TFT-LCD面板生产线小尺寸/高PPI产品核心竞争力、收益性和产品群组合。另外,本文建立高世代TFT-LCD面板生产线对盒精度分析方法、对策检讨及改善的标准流程,形成新产品阵列TP非线性补正和对盒辅助封框胶的设计基准。
        For miniaturization,thinner,high PPI(300+)and high aperture ratio of the highgeneration line's TFT-LCD panel,improvement of Ass' y margin is the essential technology.Through array and CF key position/size matching optimization and discrete optimization,we try the non-linear offset of array TP,and optimize the process of cell glass turn over,sealant design and sealant coating,the Ass' y margin is improved from 7.5μm to 5.5μm of television,monitor,notebook and tablet PC.By solving touch Mura issue of monitor and pixel light leakage issue of tablet PC,the contribution to TFT-LCD panel aperture ratio also increases with the increasing of product PPI.For product with PPI300+,the aperture ratio increase 14.8%.Effectively enhance the core competitiveness of small size and high PPI TFT-LCD product,the profitability and product mix of the high-generation line.In addition,the establishment of the analysis method,countermeasures review and standard process of the high-generation line's TFT-LCD panel Ass' y margin,the array TP non-linear offset and cell dummy sealant design guide of new TFT-LCD product are formed.
引文
[1]廖燕平,宋勇志,邵喜斌,等.薄膜晶体管液晶显示器显示原理与设计[M].北京:电子工业出版社,2016.LIAO Y P,SONG Y Z,SHAO X B,et al.Thin Film Transistor Liquid Crystal Display[M].Beijing:Publishing House of Electronics Industry,2016.(in Chinese)
    [2]齐鹏,施园,刘子源.TFT-LCD按压Mura不良的研究和改善[J].液晶与显示,2013,28(2):204-209.QI P,SHI Y,LIU Z Y.Research and improvement of按压Mura in TFT-LCD[J].Chinese Journal of liquid Crystals and Displays,2013,28(2):204-209.(in Chinese)
    [3]谢毓章.液晶物理学[M].北京:科学出版社,1988.XIE Y Z.Liquid Crystal Physics[M].Beijing:Science Press,1988.(in Chinese)
    [4]见帅敏,解洋,夏高飞,等.TFT-LCD边角漏光不良机理分析及改善研究[J].液晶与显示,2017,32(6):455-460.JIAN S M,XIE Y,XIA G F,et al.Analysis and improvement of TFT-LCD edge light-leaking mechanism[J].Chinese Journal of Liquid Crystals and Displays,2017,32(6):455-460.(in Chinese)
    [5]丁沭沂,仲雪飞,程婷,等.LCD视角的主观视觉感知评价方法[J].电子器件,2008,31(5):1425-1428.DING S Y,ZHONG X F,CHENG T,et al.Perceptual evaluation method for the viewing angle of LCD[J].Chinese Journal of Electron Devices,2008,31(5):1425-1428.(in Chinese)
    [6]张铁轶,余道平,王野,等.自动光学检测的彩膜分区检查与判定[J].液晶与显示,2014,29(1):34-39.ZHANG T Y,YU D P,WANG Y,et al.Color filter partition inspection and judgment of automatic optical inspection[J].Chinese Journal of Liquid Crystals and Displays,2014,29(1):34-39.(in Chinese)
    [7]马群刚.TFT-LCD原理与设计[M].北京:电子工业出版社,2011.MA Q G.Perceptual and Design of TFT-LCD[M].Beijing:Publishing House of Electronics Industry,2011.(in Chinese)
    [8]谷至华.薄膜晶体管(TFT)阵列制造技术[M].上海:复旦大学出版社,2007.GU Z H.Thin Film Transistor(TFT)Array Manufacturing Technology[M].Shanghai:Fudan University Press,2007.(in Chinese)
    [9]田民波,叶锋.TFT液晶显示原理与技术[M].北京:科学出版社,2010.TIAN M B,YE F.Display Principle and Technology of TFT-LCD[M].Beijing:Science Press,2010.(in Chinese)
    [10]王大巍,王刚,李俊峰,等.薄膜晶体管液晶显示器件的制造、测试与技术发展[M].北京:机械工业出版社,2007.WANG D W,WANG G,LI J F,et al.Manufacturing,Test and Technology Development of TFT-LCD[M].Beijing:China Machine Press,2007.(in Chinese)

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