摘要
提出了一种热电堆型太赫兹探测器的温度修正方法,此方法可以有效减少周围环境温度变化对探测器零点漂移和响应度等指标的影响。首先,我们用两个指标基本相同的热电堆探测器进行并联输出,其中一个作为主探测器,另一个作为参考探测器,有效减少了外界干扰引起的零点漂移。其次,我们在太赫兹探测器周围引入以温度传感器为主的温度补偿装置,通过FPGA控制实时获得周围环境的温度,并结合探测器的响应度修正系数以完成温度补偿。结果表明,零点漂移噪声由3.76mV降到了0.49mV,温漂引起的响应度变化量也从19.5mV/W降低到了2.7mV/W。此修正方法可以大幅降低温度噪声的影响,从而有效提高太赫兹探测器的性能。
The temperature correction method of a thermopile-type terahertz detector is proposed. By this method, the influence of ambient temperature on the zero drift and responsibility of the detector can be reduced effectively. Firstly, two thermopile detectors with same specifications output in parallel. One of the detectors is used as the main detector and the other one is used as the reference detector. Thus, the zero drift caused by external disturbance is reduced effectively. Secondly, a temperature-compensated device containing a temperature transducer is introduced around the thermopile detector. By using a FPGA controller to obtain ambient temperature in real time and incorporating the responsibility correction coefficient of the detector, temperature compensation is completed. The results show that the zero-drift noise is reduced from 3.76 mV to 0.49 mV and the responsibility variation caused by temperature drift is reduced from 19.5 mV/W to 2.7 mV/W. This temperature correction method can greatly reduce the impact of temperature noise and effectively improve the performance of terahertz detectors.
引文
[1]Stone M R,Naftaly M,Miles R E.Generation of Continuous Wave Terahertz Radiation Using a Two Mode Titanium Sapphire Laser Containing an Intracavity Fabry-Perot etalon[J].Journal of Applied Physics,2005,97(10):103108.
[2]Jiang Yi,Jin B B,Xu W W,et al.Terahertz Detectors Based on Superconducting Hot Electron Bolometers[J].Science China,2012,55(1):64-71.
[3]Pradere C,Caumes J P,Toutain J,et al.Absolute Self-calibrated Room-temperature Terahertz Powermeter[J].Applied Optics,2013,52(11):2320-2324.
[4]Graf A,Arndt M,Gerlach G.Seeback's Effect in Micro Machined Thermopiles for Infrared Detection[J].A Review Proc Estonian Acad Sci Eng,2007,13(4):338-353.
[5]吴宗凡,柳美琳,张绍举,等.红外与激光技术[M].北京:国防工业出版社,1998.
[6]Mancarella F,Roncaglia A,Passini M,et al.Waferlevel Testing of Thermopile IR Detectors[C].Irvine:The 4th IEEE Conference on Sensors,2005.