正弦波测量高速模数转换器(ADC)的INL/DNL
|
摘要
积分非线性(INL)和微分非线性(DNL)是数据转换器(ADC)最重要的参数之一,在高速、高动态性能数据转换器中尤其重要,对高分辨率成像应用中具有重要意义。论文简要回顾了这两个参数的定义,并系统性阐述一种非常用的正弦波测量高速模数转换器(ADC)的INL/DNL的方法。
DNL and INL are two of the most important parameters for ADC,especially important in ADC with high speed andhigh dynamic performance,and have important meaning in the application of high resolution imaging. This paper briefly reviews thedefinitions of these two parameters,and elaborates systematically on an uncommon method of testing parameters of high speed ADCusing sinewave.
DNL and INL are two of the most important parameters for ADC,especially important in ADC with high speed andhigh dynamic performance,and have important meaning in the application of high resolution imaging. This paper briefly reviews thedefinitions of these two parameters,and elaborates systematically on an uncommon method of testing parameters of high speed ADCusing sinewave.
引文
[1]Matthew Mahoney.基于数字信号处理的模拟和混合电路测试[J].电气和电子工程师协会计算机期刊,1987:146-151.Matthew Mahoney. DSP-BASED TESTING OF Analogand Mixed-Signal Circuits[J]. Computer society Press,1987:146-151.
[2]Mark Burns,Gordon W. Roberts.混合信号集成电路测试和测量[M].伦敦:牛津大学出版,2001:462-467.Mark Burns,Gordon W. Roberts.An Introduction toMixed-Signal SOC Test and Measuremen[M]. London:Oxford University Press,2001:462-467.
[3]软测公司.混合信号测试的基础[J].软测公司应用笔记,2001:109-118.Soft test Inc. The fundamentals of mixed signal testing[J].Soft test Inc Application Notice,2001:109-118.
[4]惠瑞杰公司.直方图法测试模数转换器线性参数[J].基于数字信号处理测试基础,2005,18:4-6.Verigy. Histogram Method in ADC Linearity Test[J].DSP-Based Testing-Fundamentals,2005,18:4-6.
[5]美信公司.直方图法测试鉴定DNL和INL误差[J].美信公司应用笔记,2085:1.Maxim. Histogram Testing Determines DNL and INL Er-rors[J]. Maxim Application Notice 2085:1.
[6]Kent Magnuson,Tim Quigley.用正弦波计算DNL INL[J].泰瑞达公司公司应用笔记,2808:1.Kent Magnuson,Tim Quigley. Calculating DNL INL Us-ing a Sine Wave[J]. Teradyne Application Notice,2808:1.
[7]孟德勇.模数转换器静态参数直方图法测试激励信号幅度的重要方[J].半导体技术,2005 11:12-18.Meng Deyong. A Criterion Method of the Stimulation Am-plitude for the ADC Static Parameter Histogram Test[J].Semiconductor Technology,2015,11:12-18.
[8]Walt Kester.模数转换器[J].亚德诺公司应用笔记,285:2.Walt Kester. Analog Digital Conversion[J]. ADI Applica-tion Note,285:2.
[2]Mark Burns,Gordon W. Roberts.混合信号集成电路测试和测量[M].伦敦:牛津大学出版,2001:462-467.Mark Burns,Gordon W. Roberts.An Introduction toMixed-Signal SOC Test and Measuremen[M]. London:Oxford University Press,2001:462-467.
[3]软测公司.混合信号测试的基础[J].软测公司应用笔记,2001:109-118.Soft test Inc. The fundamentals of mixed signal testing[J].Soft test Inc Application Notice,2001:109-118.
[4]惠瑞杰公司.直方图法测试模数转换器线性参数[J].基于数字信号处理测试基础,2005,18:4-6.Verigy. Histogram Method in ADC Linearity Test[J].DSP-Based Testing-Fundamentals,2005,18:4-6.
[5]美信公司.直方图法测试鉴定DNL和INL误差[J].美信公司应用笔记,2085:1.Maxim. Histogram Testing Determines DNL and INL Er-rors[J]. Maxim Application Notice 2085:1.
[6]Kent Magnuson,Tim Quigley.用正弦波计算DNL INL[J].泰瑞达公司公司应用笔记,2808:1.Kent Magnuson,Tim Quigley. Calculating DNL INL Us-ing a Sine Wave[J]. Teradyne Application Notice,2808:1.
[7]孟德勇.模数转换器静态参数直方图法测试激励信号幅度的重要方[J].半导体技术,2005 11:12-18.Meng Deyong. A Criterion Method of the Stimulation Am-plitude for the ADC Static Parameter Histogram Test[J].Semiconductor Technology,2015,11:12-18.
[8]Walt Kester.模数转换器[J].亚德诺公司应用笔记,285:2.Walt Kester. Analog Digital Conversion[J]. ADI Applica-tion Note,285:2.