应用于大面积光刻的激光图案检测系统
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  • 英文篇名:Interference lithography detection system in large area
  • 作者:侯煜 ; 胡贞 ; 王作斌 ; 翁占坤
  • 英文作者:Hou Yu;Hu Zhen;Wang Zuobin;Weng Zhankun;College of Electronic Information Engineering,Changchun University of Science and Technology;International Research Centre for Nano Handling and Manufacturing of China,Changchun University of Science and Technology;
  • 关键词:激光干涉光刻 ; 压电陶瓷控制 ; CMOS实时检测
  • 英文关键词:interference lithography;;PZT control;;CMOS real-time detection
  • 中文刊名:ZKZX
  • 英文刊名:China Sciencepaper
  • 机构:长春理工大学电子信息工程学院;长春理工大学国家纳米操纵与制造国际联合研究中心;
  • 出版日期:2015-04-23
  • 出版单位:中国科技论文
  • 年:2015
  • 期:v.10
  • 基金:国家自然科学基金资助项目(61176002);; 高等学校博士学科点专项科研基金资助项目(20112216110002);; 吉林省科技发展计划资助项目(201115157,20110704)
  • 语种:中文;
  • 页:ZKZX201508015
  • 页数:5
  • CN:08
  • ISSN:10-1033/N
  • 分类号:83-86+91
摘要
基于激光干涉光刻的基本原理,设计了新型的可应用于大面积光刻的激光图案检测系统,并阐述了利用电荷耦合元件对光刻图案的CMOS实时检测及实现大面积光刻的方法。实验结果表明,使用激光干涉光刻技术可以产生大面积的亚微米级周期性图案。该方法提供了得到高分辨、无限焦深、大面积光刻的可能性。
        The laser interference lithography is applied to design a lithographic patterns detection system for large area lithography by using complementary metal oxide semiconductor(CMOS).Experiments show that laser interference lithography technique is feasible to produce the sub-micron periodic graphics in large area.It shows the potential of interference lithography on high resolution,infinite focal depth and large area.
引文
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