热电离质谱法测定次纳克级钕同位素比值
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  • 英文篇名:Precise Isotopic Measurement of Sub-nanogram Nd by Thermal Ionization Mass Spectrometry
  • 作者:王家松 ; 彭丽娜 ; 许雅雯
  • 英文作者:WANG Jia-song;PENG Li-na;XU Ya-wen;Tianjin Institute of Geology and Mineral Resources;
  • 关键词:热电离质谱 ; 次纳克级 ; 钕同位素比值 ; 质量分馏
  • 英文关键词:Thermal ionization spectrometry;;Sub-nanogram sized;;Nd isotopic ratio;;Mass fractionation
  • 中文刊名:LHJH
  • 英文刊名:Physical Testing and Chemical Analysis(Part B:Chemical Analysis)
  • 机构:天津地质矿产研究所;
  • 出版日期:2014-10-18
  • 出版单位:理化检验(化学分册)
  • 年:2014
  • 期:v.50
  • 语种:中文;
  • 页:LHJH201410004
  • 页数:7
  • CN:10
  • ISSN:31-1337/TB
  • 分类号:20-26
摘要
采用热电离质谱法测定次纳克级钕同位素的比值。应用金属铼带对0.1~0.5ng Nd同位素标准样品进行测定,在不添加任何发射剂或者电离增强剂的条件下,采用特定的聚焦程序,获得了0.4~1V的142 Nd+稳定离子流,持续时间可达30min以上。电流范围在1 700~2 000mA之间时,质量分馏效应缓慢变低稳定。应用此方法对42个0.1~0.5ng La Jolla国际标准样品和18个0.1~0.5ng LRIG-Nd室内参考标准样品进行测定,143 Nd/144 Nd比值分别为0.511 852±0.000 002(2SE)和0.512 201±0.000 003(2SE),与其他报道参考值相符。
        Thermal ionization mass spectrometry(TIMS)was applied to the precise measurement of isotopic ratio of sub-nanogram Nd.With the Nd+method and a new type Re ribbon filament,sub-nanogram(0.1-0.5ng)standard samples of Nd were measured.Without adding any emitter or activator wading agents,0.4-1V142 Nd+ion beam was obtained and could last more than 30 minutes under special focusing procedure.With increasing current,the mass fractionation effect tended to lower and more stable in the current range of 1 700-2 000 mA.The proposed method was applied to the analysis of 42 La Jolla international standard samples of 0.1-0.5ng Nd and18LRIG-Nd in-house standard samples of 0.1-0.5ng Nd.143 Nd/144 Nd ratios measured were 0.511 852±0.000 002(2SE)and 0.512 201±0.000 003(2SE),which were in agreement with the reference values reported in literature.
引文
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