SiC单晶片切割力的广义预测控制
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  • 英文篇名:Generalized predictive control of cutting force for SiC monocrystal wafer
  • 作者:梁列 ; 李淑娟 ; 王嘉宾 ; 麻磊
  • 英文作者:LIANG Lie;LI Shujuan;WANG Jiabin;MA Lei;School of Mechanical and Instrument Engineering,Xi′an University of Technology;
  • 关键词:广义预测控制 ; 切割力 ; 加工效率 ; 表面质量 ; SiC单晶片
  • 英文关键词:generalized predictive control;;cutting force;;cutting efficiency;;surface quality;;SiC wafer
  • 中文刊名:BCKG
  • 英文刊名:Ordnance Material Science and Engineering
  • 机构:西安理工大学机械与精密仪器工程学院;
  • 出版日期:2016-03-04 16:06
  • 出版单位:兵器材料科学与工程
  • 年:2016
  • 期:v.39;No.275
  • 基金:国家自然科学基金项目(51175420);; 西安市自然科学基金项目(GX1506)
  • 语种:中文;
  • 页:BCKG201602012
  • 页数:5
  • CN:02
  • ISSN:33-1331/TJ
  • 分类号:48-52
摘要
Si C单晶因优良的物理和力学性能而大量用于大功率器件和IC行业,但由于材料的高硬度和高脆性,使其加工过程变得困难。基于进给量与切割力的差分方程,设计广义预测控制器控制切割力。结果表明:所设计控制器能够很好地跟踪不同信号,具有良好的鲁棒性;相比与普通的切割过程,能够提高加工效率,并获得较好的加工表面。
        Silicon carbide(Si C)monocrystal is widely used in high-power devices and IC industry due to its good physical and mechanical property. However,it is difficult to process because of its high hardness and brittle. Based on the difference equation of given feed and cutting force,this paper designed generalized predictive controller to control the cutting force in cutting process. The experimental results show that the controller can catch the variable singles,and has a good robustness.Compared with normal cutting process,it increases the cutting efficiency and acquires better wafer surface.
引文
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