1 MeV电子辐照对InGaAsP/InGaAs双结电池电学参数的影响
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  • 英文篇名:Effects on InGaAsP/InGaAs Double Junction Solar Cell Irradiated by 1 MeV Electrons
  • 作者:玛丽娅·黑尼 ; 赵晓凡 ; 李豫东 ; 莫敏·赛来 ; 周东 ; 艾尔肯·阿不都瓦衣提 ; 郭旗
  • 英文作者:Maliya Heini;ZHAO Xiao-fan;LI Yu-dong;Momin Sailai;ZHOU Dong;Aierken Abuduwayiti;GUO Qi;Key Laboratory of Functional Materials and Devices for Special Environments,Chinese Academy of Sciences;Xinjiang Key Laboratory of Electronic Information Materials and Devices;University of Chinese Academy of Sciences;
  • 关键词:InGaAsP/InGaAs子电池 ; 转换效率 ; 量子效率 ; 电子辐照 ; 位移损伤
  • 英文关键词:InGaAsP/InGaAs sub-cells;;conversion efficiency;;quantum efficiency;;electron irradiation;;displacement damage
  • 中文刊名:YYWL
  • 英文刊名:Modern Applied Physics
  • 机构:中国科学院特殊环境功能材料与器件重点实验室;新疆电子信息材料与器件重点实验室;中国科学院大学;
  • 出版日期:2017-12-26
  • 出版单位:现代应用物理
  • 年:2017
  • 期:v.8
  • 语种:中文;
  • 页:YYWL201704006
  • 页数:5
  • CN:04
  • ISSN:61-1491/O4
  • 分类号:36-40
摘要
为研究空间用四结太阳电池中InGaAsP/InGaAs子电池在电子辐照条件下的性能衰退情况,对InGaAsP/InGaAs双结电池开展了1 MeV电子辐照试验,测试了辐照前后的电学参数和量子效率,分析讨论了参数退化情况。结果表明:随着电子注量和位移损伤剂量的增加,电池性能参数退化程度逐渐加大;由位移损伤缺陷导致的载流子寿命减小,是导致电池短路电流和开路电压下降的主要原因;InGaAsP/InGaAs双结电池基区损伤比发射区损伤更加严重,因此,提高其抗辐射能力的关键在于优化基区结构。
        To study the performance degradation of InGaAsP/InGaAs sub-cells in the 4-junction solar cells under electron irradiation,irradiation experiments are carried out with electron of 1 MeV energy.The electrical parameters and quantum efficiency have been tested before and after irradiation.The results show that the degeneration degree of solar-cells performance increases with the increase of electron fluence and displacement damage dose,and the decrease of carrier lifetime caused by defects from displacement damage is the main reason for the degradation of solar-cell short-circuit current and open circuit voltage.InGaAsP/InGaAsdouble junction cell degrades more serious in base area than in the emissive area,which indicates that optimization in the base area is the key approach to improve the property of solar-cell radiation-hardness.
引文
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