基于数据挖掘技术的半导体测试管理系统的研究与设计
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摘要
以笔者与无锡某电子企业共同参与测试项目的半导体良率测试管理系统为平台,研究数据挖掘技术中关联规则的Apriori算法。结合半导体领域知识,追踪制造过程中已发生问题的解决方式,将数据挖掘的方法与步骤进行大量资料筛选、推演与模式建构等过程,并协助工程人员处理问题,尽可能减少在庞大的资料中挖掘的难度,快速挖掘隐含的信息,找到与问题相关的关联信息,确保问题能在较短的时间内解决,防止产品损失扩大。
The Apriori algorithm of association rules in data mining technology is studied on the platform of semiconductor yield test management system, which is jointly participated by the author and an electronic enterprise in Wuxi. Combining with the knowledge of semiconductor field, we can trace the solutions to the problems that have occurred in the manufacturing process, screen,deduce and construct a large number of data by data mining methods and steps, and assist engineers in dealing with the problems. We can minimize the difficulty of mining the huge data, quickly mine the hidden information, find the relevant information related to the problems, and ensure the problems. It can be solved in a relatively short time to prevent the expansion of product losses.
The Apriori algorithm of association rules in data mining technology is studied on the platform of semiconductor yield test management system, which is jointly participated by the author and an electronic enterprise in Wuxi. Combining with the knowledge of semiconductor field, we can trace the solutions to the problems that have occurred in the manufacturing process, screen,deduce and construct a large number of data by data mining methods and steps, and assist engineers in dealing with the problems. We can minimize the difficulty of mining the huge data, quickly mine the hidden information, find the relevant information related to the problems, and ensure the problems. It can be solved in a relatively short time to prevent the expansion of product losses.
引文
[1]李国强.基于模糊聚类与关联分析的备件分类与预测研究——以某半导体封装测试公司为例[D].成都:西南交通大学,2016:73,
[2]赵婷婷,曹政才,邱明辉.面向半导体生产线基于MAS模糊协同的成品率预测方法[J].计算机集成制造系统,2017(4):852-859.
[3]彭苏娥.半导体器件成品率的高低是产品质量与可靠性高低的“预示”[J].电子产品可靠性与环境试验,2002(3):58-52.
[4]王晓辉,周雪芳,刘国新.关联规则Apriori算法的研究和改进[J].信息与电脑(理论版),2019(5):71-72.
[2]赵婷婷,曹政才,邱明辉.面向半导体生产线基于MAS模糊协同的成品率预测方法[J].计算机集成制造系统,2017(4):852-859.
[3]彭苏娥.半导体器件成品率的高低是产品质量与可靠性高低的“预示”[J].电子产品可靠性与环境试验,2002(3):58-52.
[4]王晓辉,周雪芳,刘国新.关联规则Apriori算法的研究和改进[J].信息与电脑(理论版),2019(5):71-72.