基于C8051F040的智能型电接点水位探头二次仪表设计
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  • 英文篇名:Design of Intelligent Secondary Instrument for Electrical Contact Level Probe Based on C8051F040
  • 作者:吕鑫 ; 朱毖微 ; 吴茜
  • 英文作者:LV Xin;ZHU Bi-wei;WU Qian;Science and Technology on Reactor System Design Technology Laboratory;
  • 关键词:电接点水位探头 ; 二次仪表 ; C8051F040 ; SCADE
  • 英文关键词:electric contact level probe;;secondary instrument;;C8051F040;;SCADE
  • 中文刊名:IKJS
  • 英文刊名:Measurement & Control Technology
  • 机构:核反应堆系统设计技术国家级重点实验室;
  • 出版日期:2018-11-18
  • 出版单位:测控技术
  • 年:2018
  • 期:v.37;No.321
  • 语种:中文;
  • 页:IKJS201811023
  • 页数:4
  • CN:11
  • ISSN:11-1764/TB
  • 分类号:88-91
摘要
电接点水位探头是一种工业上常用的液位开关,二次仪表是影响电接点水位探头使用寿命的重要因素,为延长电接点水位探头寿命,提出了一种智能型电接点水位探头二次仪表的设计。二次仪表以C8051F040微控制器为核心并辅以激励电源产生电路、取样电路、多探头巡检电路和输出电路。二次仪表通过微控制器的软件进行控制,软件采用C语言编码,重要代码的编码采用SCADE建模后自动生成。实际测试结果表明,采用上述设计的二次仪表单台可接收8支水位探头信号,总响应时间不超过1s,能够有效提高水位探头寿命。
        Electrical contact level probe is a kind of level switch commonly used in the industry. The secondary instruments affect probe' s durability quitely. In order to extend the durability of the probe, an intelligent secondary instrument design is presented for electrical contact level probe. The secondary instrument is based on the C8051 F040 microcontroller with excitation power circuit, sampling circuit, circulation detection circuit and output circuit. The whole instrument is controlled by software embedded in the microcontroller which is coded in C language. Critical codes are generated automatically by SCADE models. The actual test results demonstrate that the secondary instrument designed as above can deal with eight probes and the total response time is less than 1 s, which can effectively enhance the durability of the probe.
引文
[1]陈学永,张涛,沈士权.智能型电接点水位计[J].仪表技术与传感器,2005(4).
    [2]万嵩,丁玮,高炼.一种新型电接点液位检测仪[J].船电技术,2010,30(12).
    [3]魏智勇.普通电接点水位计问题技术浅析及解决方法[J].科技创新导报,2009(35).
    [4]吴玺泽,李梅娟,吴华玲.基于STC12C5A16AD的电接点液位控制系统设计[J].辽宁科技大学学报,2012,35(6).
    [5] Silicon Laboratory Inc. C8051F040/1/2/3/4/5/6/7混合信号ISP FLASH微控制器数据手册[Z].潘琢金,译.2004.

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