基于高压瓷质绝缘子红外检测盲区的实验分析
|
摘要
红外技术是检测高压瓷质绝缘子劣化情况的一种有效手段,绝缘子随着阻值的减少而呈现出发热功率先增加后减少的一种趋势,因此绝缘子红外检测技术存在一定的盲区。通过戴维南等效电路法计算红外检测盲区,着重考虑绝缘子红外检测盲区的范围并进行定量的分析,然后设计相关实验探索盲区检测环境条件以提高红外检测盲区的准确率。在计算红外检测盲区的基础上设计针对盲区检测的环境因素影响实验,实验结果表明:在改变相关环境因素的条件下,劣化绝缘子红外检测盲区的诊断准确率有着较大的提高。
In the application of porcelain insulator detection,infrared detection technology is a reliable and efficient detection means. Heating power of Insulator appears on a trend of increase after the decrease as the decreasing of resistance,so insulators infrared detection technology has blind areas. Compute the blind areas of the infrared detection by using Thevenin Equivalent. Taking the infrared detection blind areas range into consideration,then design related experiments to explore blind spot detection environment conditions to improve the accuracy in infrared detection blind area. In this paper,on the basis of calculating the infrared detection blind area under designing for blind spot detection of environmental factors that affect the experiment,the experimental results show that: Under the condition of the change of relevant environmental factors,degraded insulator infrared detection blind area has a larger increase diagnostic accuracy.
In the application of porcelain insulator detection,infrared detection technology is a reliable and efficient detection means. Heating power of Insulator appears on a trend of increase after the decrease as the decreasing of resistance,so insulators infrared detection technology has blind areas. Compute the blind areas of the infrared detection by using Thevenin Equivalent. Taking the infrared detection blind areas range into consideration,then design related experiments to explore blind spot detection environment conditions to improve the accuracy in infrared detection blind area. In this paper,on the basis of calculating the infrared detection blind area under designing for blind spot detection of environmental factors that affect the experiment,the experimental results show that: Under the condition of the change of relevant environmental factors,degraded insulator infrared detection blind area has a larger increase diagnostic accuracy.
引文
[1]黄军凯,曾华荣,杨佳鹏,周海.红外热像技术在低零值绝缘子检测中的应用[J].电瓷避雷器,2013(02):40-44.HUANG Junkai,ZENG Huarong,YANG Jiapeng,ZHOU Hai. Application of infrared thermal imaging technology to detection of low and zero resistance insulators[J]. Insulatorsand Surge Arresters,2013(02):40-44.
[2]何洪英,姚建刚,蒋正龙,等.基于支持向量机的高压绝缘子污秽等级红外热像检测[J].电力系统自动化,2005,29(24):70-74,82.HE Hongying,YAO Jiangang,JIANG Zheng Long,et al.Infrared thermal image detecting of high voltage insulator contamination grades based on Support Vector Ma-chine[J]. Automation of Electric Power Systems,2005,24:70-74+82.
[3]李佐胜,姚建刚,杨迎建,等.湿污绝缘子发热模型[J].电工技术学报,2009(07):21-27.LI Zuosheng,YAO Jiangang,YANG Yingjian,et al.Heating model of polluted and wetted insulators. Transactions of China Electrotechnical Society,2009(07):21-27
[4]胡世征.劣化绝缘子的发热机理及热象特征[J].电网技术,1997(10):44-46.HU Shizheng. Heating mechanism and thermograph of degradated insulators[J]. Power System Technology,1997(10):44-46
[5]金光熙,权光日,郎成,等.故障绝缘子的发热机理及其红外热像检测[J].电瓷避雷器,2011(05):12-15.JIN Guang Xi,QUAN Guangri,LANG Cheng,et al. Heating mechanism and infrared thermography detection of failure insulators. Insulators and Surge Arresters,2011(05):12
[6]梁飞,MacAlpine Mark,关志成,等.污秽绝缘子表面干区形成的影响因素[J].高电压技术,2012(10):2604-2610.LIANG Fei,MacAlpine Mark,GUAN Zhicheng,et al.Factors affecting dry-band formation on the surface of polluted insulator. High Voltage Engineering,2012(10):2604-2610
[7]安玲,江秀臣,朱宇,等.检测劣质绝缘子的新方法——敏感绝缘子法[J].中国电机工程学报,2002,22(9):108-112.AN Ling,JIANG Xiucheng,ZHU Yu,et al. Sensitive insulator method—a new method to detect the faulty insulator[J]. Proceedings of the CSEE,2002,22(8):108-112.
[8]张志劲,张东东,袁超,等.污秽成分对XP-160绝缘子串交流闪络特性的影响[J].高电压技术,2014,40(7):1970-1976.ZHANG Zhijin,ZHANG Dongdong,YUAN Chao,et al.Effect of contamination component on AC flashover performance of insulator string XP-160[J]. High Voltage Engineering,2014,40(7):1970-1976.
[9] KONTARGYRI V T,STATHOPULOS I A. Measurement and simulation of the voltage distribution and the electric field on aglass insulator string[J]. Science Direc,2008,14(41):471-480.
[10]蒋兴良,黄斌,苑吉河,等.电网络法计算交流特高压绝缘子串电压分布[J].高电压技术,2008,34(1):7-10.JIANG Xingliang,HUAN Bing,YUAN Jihe,et al. Calculation of voltage distribution along insulator strings of UHV AC transmission line by electric-network method[J]. High Voltage Engineering,2008,34(1):7-10.
[11]姚建刚,关石磊,陆佳政,等.相对温度分布特征与人工神经网络相结合的零值绝缘子识别方法[J].电网技术,2012,36(2):170-175.YAO Jiangang,GUAN Shilei,LU Jiazheng,et al. Identification of zero resistance insulators by combining relative temperature distribution characteristics with artificial neural network[J]. Power System Technology,2012,36(2):170-175.
[12]张友鹏,伍亚萍,董海燕,等.基于遗传算法的绝缘子泄漏电流估算[J].高电压技术,2015,41(8):2757-2763.ZHANG Youpeng,WU Yaping,DONG Haiyan,et al.Evaluation of Leakage Current of Insulators Based on the Genetic Algorithm[J]. High Voltage Engineering,2015,41(8):2757-2763.
[13] MIZUNO Y,NAITO K. Voltage and Temperature Distribution Along Semiconducting Glaze Insulator Strings[J].IEEE Transactions on Dielectrics and Electrical Insulation,1999,6(1):100-104.
[14]李佐胜,李文利,姚建刚,等.应用绝缘子红外热像处理的现场污秽等级检测方法[J].中国电机工程学报,2010,30(4):132-138.LI Zuosheng,LI Wenli,YANG Yingjian,et al. On-site detection of pollution level of insulators based on infraredthermal-image processing[J]. Power System Technology,2010,33(4):132-138.
[15]金光熙,权光日,等.高压绝缘子串电压分布以及表面温升的理论研究[J].北华大学学报(自然科学版),2011,12(6):733-736.JIN Guangxi,QUAN Guangri,GENG Juncheng,et al.Theoretical study of the voltage distribution and the surface temperature rise of high voltage insulator strings[J]. Journal Of beihua university(Natural Science),2011,12(6):733-736.
[16]陈永辉,蔡葵.供电设备红外诊断技术[M]. 1版.北京:中国水利水电出版社,2005:75-80.CHEN Yonghui,CAI Kui. Infrared diagnosis technology of power equipment[M]. Beijing,China:China Water Power Press,2005.
[2]何洪英,姚建刚,蒋正龙,等.基于支持向量机的高压绝缘子污秽等级红外热像检测[J].电力系统自动化,2005,29(24):70-74,82.HE Hongying,YAO Jiangang,JIANG Zheng Long,et al.Infrared thermal image detecting of high voltage insulator contamination grades based on Support Vector Ma-chine[J]. Automation of Electric Power Systems,2005,24:70-74+82.
[3]李佐胜,姚建刚,杨迎建,等.湿污绝缘子发热模型[J].电工技术学报,2009(07):21-27.LI Zuosheng,YAO Jiangang,YANG Yingjian,et al.Heating model of polluted and wetted insulators. Transactions of China Electrotechnical Society,2009(07):21-27
[4]胡世征.劣化绝缘子的发热机理及热象特征[J].电网技术,1997(10):44-46.HU Shizheng. Heating mechanism and thermograph of degradated insulators[J]. Power System Technology,1997(10):44-46
[5]金光熙,权光日,郎成,等.故障绝缘子的发热机理及其红外热像检测[J].电瓷避雷器,2011(05):12-15.JIN Guang Xi,QUAN Guangri,LANG Cheng,et al. Heating mechanism and infrared thermography detection of failure insulators. Insulators and Surge Arresters,2011(05):12
[6]梁飞,MacAlpine Mark,关志成,等.污秽绝缘子表面干区形成的影响因素[J].高电压技术,2012(10):2604-2610.LIANG Fei,MacAlpine Mark,GUAN Zhicheng,et al.Factors affecting dry-band formation on the surface of polluted insulator. High Voltage Engineering,2012(10):2604-2610
[7]安玲,江秀臣,朱宇,等.检测劣质绝缘子的新方法——敏感绝缘子法[J].中国电机工程学报,2002,22(9):108-112.AN Ling,JIANG Xiucheng,ZHU Yu,et al. Sensitive insulator method—a new method to detect the faulty insulator[J]. Proceedings of the CSEE,2002,22(8):108-112.
[8]张志劲,张东东,袁超,等.污秽成分对XP-160绝缘子串交流闪络特性的影响[J].高电压技术,2014,40(7):1970-1976.ZHANG Zhijin,ZHANG Dongdong,YUAN Chao,et al.Effect of contamination component on AC flashover performance of insulator string XP-160[J]. High Voltage Engineering,2014,40(7):1970-1976.
[9] KONTARGYRI V T,STATHOPULOS I A. Measurement and simulation of the voltage distribution and the electric field on aglass insulator string[J]. Science Direc,2008,14(41):471-480.
[10]蒋兴良,黄斌,苑吉河,等.电网络法计算交流特高压绝缘子串电压分布[J].高电压技术,2008,34(1):7-10.JIANG Xingliang,HUAN Bing,YUAN Jihe,et al. Calculation of voltage distribution along insulator strings of UHV AC transmission line by electric-network method[J]. High Voltage Engineering,2008,34(1):7-10.
[11]姚建刚,关石磊,陆佳政,等.相对温度分布特征与人工神经网络相结合的零值绝缘子识别方法[J].电网技术,2012,36(2):170-175.YAO Jiangang,GUAN Shilei,LU Jiazheng,et al. Identification of zero resistance insulators by combining relative temperature distribution characteristics with artificial neural network[J]. Power System Technology,2012,36(2):170-175.
[12]张友鹏,伍亚萍,董海燕,等.基于遗传算法的绝缘子泄漏电流估算[J].高电压技术,2015,41(8):2757-2763.ZHANG Youpeng,WU Yaping,DONG Haiyan,et al.Evaluation of Leakage Current of Insulators Based on the Genetic Algorithm[J]. High Voltage Engineering,2015,41(8):2757-2763.
[13] MIZUNO Y,NAITO K. Voltage and Temperature Distribution Along Semiconducting Glaze Insulator Strings[J].IEEE Transactions on Dielectrics and Electrical Insulation,1999,6(1):100-104.
[14]李佐胜,李文利,姚建刚,等.应用绝缘子红外热像处理的现场污秽等级检测方法[J].中国电机工程学报,2010,30(4):132-138.LI Zuosheng,LI Wenli,YANG Yingjian,et al. On-site detection of pollution level of insulators based on infraredthermal-image processing[J]. Power System Technology,2010,33(4):132-138.
[15]金光熙,权光日,等.高压绝缘子串电压分布以及表面温升的理论研究[J].北华大学学报(自然科学版),2011,12(6):733-736.JIN Guangxi,QUAN Guangri,GENG Juncheng,et al.Theoretical study of the voltage distribution and the surface temperature rise of high voltage insulator strings[J]. Journal Of beihua university(Natural Science),2011,12(6):733-736.
[16]陈永辉,蔡葵.供电设备红外诊断技术[M]. 1版.北京:中国水利水电出版社,2005:75-80.CHEN Yonghui,CAI Kui. Infrared diagnosis technology of power equipment[M]. Beijing,China:China Water Power Press,2005.