相位测量偏折术中高质量条纹的获取
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摘要
相位测量偏折术中的相位误差主要分为CCD相机的随机误差以及由结构光照明光源与CCD相机的非线性响应导致的非线性误差。从影响相位误差的根源分析,建立了条纹质量与相位误差、相机镜头光圈数、编码条纹的周期、调制度等因素的分析模型,并对该模型的可靠性与正确性进行仿真与实验验证。理论分析、仿真与实验结果表明:获取条纹的对比度与相机镜头光圈数、编码条纹的周期和调制度成正比,获取条纹的正弦性与相机镜头光圈数、编码条纹的周期及调制度成反比。根据该条纹质量分析模型优化系统参数,可以获得高质量的条纹。该条纹质量分析模型同样适用于面结构光三维测量等其他技术。
The random error introduced by CCD camera and the nonlinear error caused by the nonlinear response function of illuminant and CCD camera are two main errors in phase measuring deflectometry.Based on the analysis of the factors affecting the phase error,we establish the analysis model of fringe pattern quality and the factors such as phase error,F value of camera lens,the period of coded fringe pattern,and modulation.The reliability and correctness of the proposed model are verified by computer simulation and experiment.The results of theoretical analysis,simulation,and experimental results show that the contrast ratio of the obtained fringe pattern is proportional to F value of the camera lens and the period and the modulation of the fringe pattern.The sinuousness of fringe is inversely proportional to F value of the camera lens and the period and the modulation of the generated fringe pattern.According to the proposed fringe quality analysis model,high quality fringe pattern can be obtained by optimizing the system parameters.The proposed model can apply to other techniques,such as surface-structured light three-dimensional measurement.
The random error introduced by CCD camera and the nonlinear error caused by the nonlinear response function of illuminant and CCD camera are two main errors in phase measuring deflectometry.Based on the analysis of the factors affecting the phase error,we establish the analysis model of fringe pattern quality and the factors such as phase error,F value of camera lens,the period of coded fringe pattern,and modulation.The reliability and correctness of the proposed model are verified by computer simulation and experiment.The results of theoretical analysis,simulation,and experimental results show that the contrast ratio of the obtained fringe pattern is proportional to F value of the camera lens and the period and the modulation of the fringe pattern.The sinuousness of fringe is inversely proportional to F value of the camera lens and the period and the modulation of the generated fringe pattern.According to the proposed fringe quality analysis model,high quality fringe pattern can be obtained by optimizing the system parameters.The proposed model can apply to other techniques,such as surface-structured light three-dimensional measurement.
引文
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[15]Zhou Ping,Zhu Tongjing,Liu Xinran,et al.Correction of phase error overcompensation and under-compensation in structured light measurement[J].Optics and Precision Engineering,2015,23(1):56-62.周平,朱统晶,刘欣冉,等.结构光测量中相位误差的过补偿与欠补偿校正[J].光学精密工程,2015,23(1):56-62.
[16]Zhang S,Huang P S.Phase error compensation for a 3-D shape measurement system based on the phase-shifting method[J].Optical Engineering,2007,46(6):063601.
[17]Peng J Z,Ouyang H K,Yu Q,et al.Phase error correction for fringe projection profilometry by using constrained cubic spline[J].Advances in Manufacturing,2014,2(1):39-47.
[18]Zhang S.Active versus passive projector nonlinear gamma compensation method for high-quality fringe pattern generation[C].SPIE,2014,9110:911002.
[19]Zhao Bing,Guo Bin,Fang Ruhua,et al.Effect of quantization error on the computed of phase shifting measurement[J].Acta Optica Sinica,1996,16(12):1767-1772.赵兵,郭彬,方如华,等.相位移法中的量化误差效应[J].光学学报,1996,16(12):1767-1772.
[20]Li Yong.Study on key technology and application of phase measurement profilometry[D].Chengdu:Sichuan University,2006.李勇.相位测量轮廓术关键技术及应用研究[D].成都:四川大学,2006.
[21]Zhang Kexiong,Cao Yiping,Huang Qianghui.A method of restraining the digitalized error in phase measurement profilometry[J].Journal of Optoelectronics·Laser,20(2):221-224.张可雄,曹益平,黄强辉.一种抑制相位测量轮廓术数字化误差的方法[J].光电子·激光,2009,20(2):221-224.
[22]Hu E,Hu Y,Fang H F.A novel phase-recovering algorithm for the intensity quantization error in the digital grating phase-shifting profilometry[J].Optik,2011,122:2227-2229.
[23]Wu Y X,Yue H M,Yi J Y,et al.Phase error analysis and reduction in phase measuring deflectometry[J].Optical Engineering,2015,54(6):064103.
[2]Xiao Yongliang,Su Xianyu,Chen Wenjing.Specular shape measurement with phase measuring deflectometry based on bundle adjustment[J].Acta Optica Sinica,2011,31(12):1212007.肖永亮,苏显渝,陈文静.基于光束法平差的相位测量偏折术镜面面形测量[J].光学学报,2011,31(12):1212007.
[3]Wu Zhiyun.Carrier removal method in fringe projection profilometry using Zernike polynomials[J].Acta Optica Sinica,2011,31(4):0412011.吴志云.用泽尼克多项式消除三维轮廓术中的条纹载频[J].光学学报,2011,31(4):0412011.
[4]Song L,Yue H M,Kim H,et al.A study on carrier phase distortion in phase measuring deflectometry with nontelecentric imaging[J].Optics Express,2012,20(22):24505-24515.
[5]Wu Y X,Yue H M,Li M Y,et al.Dynamic specular surface measurement based on color-encoded fringe reflection technique[J].Optical Engineering,2016,55(2):024104.
[6]Yue H M,Wu Y X,Zhao B Y,et al.A carrier removal method in phase measuring deflectometry based on the analytical carrier phase description[J].Optics Express,2013,21(19):21756-21765.
[7]Song L,Yue H M,Liu Y,et al.Phase unwrapping method based on reliability and digital point array[J].Optical Engineering,2011,50(4):43605.
[8]Wu Y X,Yue H M,Yi J Y,et al.Single-shot three-dimensional shape measurement of specular surfaces by orthogonal color fringe pattern reflection technique[C].SPIE,2014,9276:927603.
[9]Song Lei.Three-dimensional morphology measurement based on fringe projection and fringe reflectance[D].Chengdu:University of Electronic Science and Technology of China,2012.宋雷.基于条纹投影和条纹反射的三维形貌测量[D].成都:电子科技大学,2012.
[10]Su X Y,Zhou W S,von Bally G,et al.Automated phase-measuring profilometry using defocused projection of a Ronchi grating[J].Optics Communications,1992,94(6):561-573.
[11]Guo H W,Zhao Z.Nonlinearity correction in digital fringe projection profilometry by using histogram matching technique[C].SPIE,2007,6616:661621.
[12]Xiao Yanshan,Cao Yiping,Wu Yingchun,et al.Gamma nonlinearity correction based on Fourier spectrum analysis for phase measuring profilometry[J].Acta Optica Sinica,2012,32(12):1212004.肖焱山,曹益平,武迎春,等.基于傅里叶频谱分析的相位测量轮廓术系统Gamma非线性校正方法[J].光学学报,2012,32(12):1212004.
[13]Liu K,Wang Y C,Lau D L,et al.Gamma model and its analysis for phase measuring profilometry[J].Journal of the Optical Society of American,2010,27(3):553-562.
[14]Hoang T,Pan B,Nguyen D,et al.Generic gamma correction for accuracy enhancement in fringe-projection profilometry[J].Optics Letters,2010,35(12):1992-1994.
[15]Zhou Ping,Zhu Tongjing,Liu Xinran,et al.Correction of phase error overcompensation and under-compensation in structured light measurement[J].Optics and Precision Engineering,2015,23(1):56-62.周平,朱统晶,刘欣冉,等.结构光测量中相位误差的过补偿与欠补偿校正[J].光学精密工程,2015,23(1):56-62.
[16]Zhang S,Huang P S.Phase error compensation for a 3-D shape measurement system based on the phase-shifting method[J].Optical Engineering,2007,46(6):063601.
[17]Peng J Z,Ouyang H K,Yu Q,et al.Phase error correction for fringe projection profilometry by using constrained cubic spline[J].Advances in Manufacturing,2014,2(1):39-47.
[18]Zhang S.Active versus passive projector nonlinear gamma compensation method for high-quality fringe pattern generation[C].SPIE,2014,9110:911002.
[19]Zhao Bing,Guo Bin,Fang Ruhua,et al.Effect of quantization error on the computed of phase shifting measurement[J].Acta Optica Sinica,1996,16(12):1767-1772.赵兵,郭彬,方如华,等.相位移法中的量化误差效应[J].光学学报,1996,16(12):1767-1772.
[20]Li Yong.Study on key technology and application of phase measurement profilometry[D].Chengdu:Sichuan University,2006.李勇.相位测量轮廓术关键技术及应用研究[D].成都:四川大学,2006.
[21]Zhang Kexiong,Cao Yiping,Huang Qianghui.A method of restraining the digitalized error in phase measurement profilometry[J].Journal of Optoelectronics·Laser,20(2):221-224.张可雄,曹益平,黄强辉.一种抑制相位测量轮廓术数字化误差的方法[J].光电子·激光,2009,20(2):221-224.
[22]Hu E,Hu Y,Fang H F.A novel phase-recovering algorithm for the intensity quantization error in the digital grating phase-shifting profilometry[J].Optik,2011,122:2227-2229.
[23]Wu Y X,Yue H M,Yi J Y,et al.Phase error analysis and reduction in phase measuring deflectometry[J].Optical Engineering,2015,54(6):064103.