二次电子对离子束流品质影响的动态研究
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摘要
基于粒子云网格的计算方法,建立了具有外电路的加速系统模型,模拟了氘离子束轰击靶面产生二次电子的过程,动态地分析了二次电子的产生对离子加速电压的影响以及对氘离子束束流品质和氘离子束轰击靶面能量的影响。结果表明,当有0.06A的二次电子电流产生时,离子加速电压将会下降45%,从而导致氘离子束束流品质下降,参与氘氚反应的氘离子数减少,相应的氘离子束轰击靶面的能量下降43.8%。
This paper uses the technique of particle-in-cell to build an accelerating section model with external circuit to simulate the electron effect of deuterium ion beam bombarding the target surface and analyze the influence of secondary electrons on acceleration voltage,quality of deuterium ion beam and energy beam bombarding the target dynamically.The results indicate that the acceleration voltage will decrease 45% when there is 0.06 Aelectron current,which then lead to the deterioration of deuterium ion beam's quality.The energy of beam bombarding the target decrease 43.5%,which will influence the neutron yield.
This paper uses the technique of particle-in-cell to build an accelerating section model with external circuit to simulate the electron effect of deuterium ion beam bombarding the target surface and analyze the influence of secondary electrons on acceleration voltage,quality of deuterium ion beam and energy beam bombarding the target dynamically.The results indicate that the acceleration voltage will decrease 45% when there is 0.06 Aelectron current,which then lead to the deterioration of deuterium ion beam's quality.The energy of beam bombarding the target decrease 43.5%,which will influence the neutron yield.
引文
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[15]Ke Jianlin,Liu Meng,Zhou Changgeng.Deuteron induced secondary electron emission from titantium deuteride surface[J].Nuclear Instruments and Methods in Physics Research B,2012,280(6):1-4.
[2]汤明.热中子照相及其质量控制[J].宇航材料工艺,1994,24(4):42-46.(Tang Ming.Thermal neutron radiography and quality control.Aerospace Materials and Technology,1994,24(4):42-46)
[3]魏晓云.用14MeV中子进行违禁品检测的实验装置屏蔽研究[D].长春:东北师范大学,2007:8-20.(Wei Xiaoyun.The study on the shielding of the device of detecting contrabands by 14MeV neutron sources.Changchun:Northeast Normal University,2007:8-20)
[4]Reijonen J,Leung K N,Firestone R B.First PGAA and NAA experimental results from a compact high intensity D-D neutron generator[J].Nuclear Instruments and Methods in Physics Research,2004,522(3):598-602.
[5]Reijonen J.Neutron generators developed at LBNL for homeland security and imaging applications[J].Nuclear Instruments and Methods in Physics Research,2007,261:272-276.
[6]Chichester D L,Simpson J D,Lemchak M.Advanced compact accelerator neutron generator technology for active neutron interrogation field work[J].Journal of Radioanalytical and Nuclear Chemistry,2007,271(3):629-637.
[7]Kim I J,Jung N S,Jung H D,et al.A D-D neutron generator using a titanium drive-in target[J].Nuclear Instruments and Methods in Physics Research,2008,266(5):829-933.
[8]乔亚华.中子管的研究进展及应用[J].核电子学与探测技术,2008,28(6):1134-1139.(Qiao Yahua.Progress in studies and applications of neutron tube.Nuclear Electronics and Detection Technology,2008,28(6):1134-1139)
[9]刘圣康.中子物理[M].北京:原子能出版社,1986:36-48.(Liu Shengkang.Neutron physics.Beijing:Atomic Energy Press,1986:36-48)
[10]金斗英.密封式中子管中电子电流形成过程[J].吉林大学自然科学学报,1998,1(1):40-44.(Jin Douying.The formation process of the electron current in a sealed neutron tube.Acta Scientiarum Naturalium Universitatis Jilinensis,1998,1(1):40-44)
[11]王静,段萍.中子管靶面二次电子抑制[J].长安大学学报:自然科学版,2003,23(2):107-110.(Wang Jing,Duan Ping.Principle and method of controlling second production of electrons from target surface.Journal of Chang'an University:Natural Science Edition,2003,23(2):107-110)
[12]金大志,杨中海,戴晶怡.中子发生器中二次电子抑制的数值模拟[J].电子科技大学学报,2009,38(1):83-86.(Jin Dazhi,Yang Zhonghai,Dai Jingyi.Simulation for suppressing of secondary electrons in neutron generator.Journal of University of Electronic Science and Technology of China,2009,38(1):83-86)
[13]杨振,彭宇飞,龙继东,等.脉冲离子束作用下靶面次级电子的抑制[J].强激光与粒子束,2012,24(9):2198-2202.(Yang Zhen,Peng Yufei,Long Jidong,et al.Suppression of secondary electrons from target surface under pulsed ion beams bombardment.High Power Laser and Particle Beams,2012,24(9):2198-2202)
[14]Lin M C,Zhou C D,Smithe D N.An external circuit model for 3-D electromagnetic particle-in-cell simulations[J].IEEE Trans Electron Devices,2014,61(6):2-7.
[15]Ke Jianlin,Liu Meng,Zhou Changgeng.Deuteron induced secondary electron emission from titantium deuteride surface[J].Nuclear Instruments and Methods in Physics Research B,2012,280(6):1-4.