摘要
用XFDTD软件模拟计算了雷电电场强度为50 k V、上升沿约为4μs、脉宽为20μs的雷电电磁脉冲与计算机耦合后,在计算机机箱内几个典型位置处的耦合电场强度和能量密度随时间变化的曲线,并分析了计算机内部不同位置处的屏蔽效能。耦合产生的能量密度与对计算机系统造成损害的电磁脉冲功率密度的阈值相比可知,机箱内耦合产生的能量不影响计算机的正常工作,但在孔洞处耦合产生的能量很大。
Using XFDTD software simulating strong lightning electromagnetic pulse of 50 kV lightning electric field strength, rising about 4 μs, the pulse width about 20 μs, coupling with a desktop computer, getting the electric field coupling curve changes with time and energy density curve changes over time at several typical locations in the chassis; Analysis the shielding effectiveness of different locations inside the computer. The result compared with the threshold electromagnetic pulse power density, which suggests that the electromagnetic field strength produced in the chassis will do nothing damage to the computer node while coupling energy generated in the hole is large, provides a reference for EMC design of the portable computer.
引文
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