缺陷方向对磁致伸缩导波检测敏感性影响分析
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  • 英文篇名:Analysis on Sensitivity of Magnetostrictive Guided Wave Detection to Defect Direction
  • 作者:龙盛蓉 ; 黄永跃 ; 李志农 ; 徐长英 ; 淦文建
  • 英文作者:LONG Shengrong;HUANG Yongyue;LI Zhinong;XU Changying;GAN Wenjian;Key Laboratory of Nondestructive Testing Ministry of Education,Nanchang Hangkong University;Engineering Training Center, Nanchang Hangkong University;
  • 关键词:磁致伸缩 ; 管道检测 ; 导波模态 ; 缺陷方向 ; 敏感性
  • 英文关键词:magnetostriction;;pipeline detection;;guided wave mode;;defect direction;;sensitivity
  • 中文刊名:HQDB
  • 英文刊名:Journal of Huaqiao University(Natural Science)
  • 机构:南昌航空大学无损检测技术教育部重点实验室;南昌航空大学工程训练中心;
  • 出版日期:2019-05-20
  • 出版单位:华侨大学学报(自然科学版)
  • 年:2019
  • 期:v.40;No.167
  • 基金:国家重点研发计划资助项目(2016YFF0203000);; 国家自然科学基金资助项目(51675258,51261024);; 江西省教育厅科学技术研究项目(GJJ150699);; 江西省自然科学基金资助项目(20171BAB206039);; 教育部重点实验室开放基金资助项目(ZD201429003)
  • 语种:中文;
  • 页:HQDB201903005
  • 页数:7
  • CN:03
  • ISSN:35-1079/N
  • 分类号:38-44
摘要
采用有限元仿真与实验相结合的方法建立磁致伸缩导波管道检测平台,在待测管道上预置与周向分别呈0°~90°的10个大小相同的槽型缺陷,依次利用L(0,2)纵向模态导波和T(0,1)扭转模态导波进行检测.仿真和实验结果均表明:L(0,2)导波缺陷回波幅值随着缺陷角度增加而逐渐降低,50°时已经难以分辨出缺陷信号,L(0,2)导波适合检测50°以下缺陷;T(0,1)导波的缺陷幅值随着缺陷角度的增加先减小后增大,并且整体具有较高的信噪比,T(0,1)模态导波对各个方向的缺陷检测均有良好的适用性.
        A magnetostrictive guided wave pipeline inspection platform was established by means of finite element simulation and experiment. 10 grooved defects with the same size were preseted on the pipeline. The angle between them and the circumference was from 0 to 90 degrees. L(0,2) longitudinal mode guided waves and T(0,1) torsional mode guided waves were used to conduct pipeline detection in turn. Both simulation and experimental results show that the amplitude of L(0,2) guided wave defect echo decreases gradually with the increase of defect angle, and it is difficult to distinguish the defect signal when it is 50 degrees, which are more suitable for defect detection below 50 degrees; the defect amplitude of T(0,1) guided wave decreases first and then increases with the increase of defect angle, and the signal-to-noise ratio is high, which have good applicability for defect detection in all directions.
引文
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