X射线衍射技术测量残余应力在研究生实验教学中的应用
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摘要
利用X射线衍射技术测量残余应力,开设科学探究性实验教学项目,让学生了解表面残余应力的概念、分类、产生原因及测试方法,学习X射线衍射(XRD)方法测量铝合金或者薄膜材料残余应力的实验原理和理论方法,熟练掌握XRD仪器设备的操作过程。通过该教学实验,培养学生的科研素养和能力,增强学生的科学探索与创新精神。
As an experimental teaching,residual stress is measured by X-ray diffraction( XRD). The experiment provides students an opportunity to have a better understanding of the theorem. Meanwhile,students could comprehend the concept,causes,classification of residual stress and grasp operation of XRD equipment. Thus,research and innovation abilities of graduates would be cultivated through the overall teaching process.
As an experimental teaching,residual stress is measured by X-ray diffraction( XRD). The experiment provides students an opportunity to have a better understanding of the theorem. Meanwhile,students could comprehend the concept,causes,classification of residual stress and grasp operation of XRD equipment. Thus,research and innovation abilities of graduates would be cultivated through the overall teaching process.
引文
[1]邵淑英,范正修,范瑞瑛,等.Zr O2薄膜残余应力实验研究[J].光学学报,2004,24(4):437-441.
[2]王秋成,柯映林.航空高强度铝合金残余应力的抑制与消除[J].航空材料学报,2002,22(3):59-62.
[3]Chason E,Sheldon B W,Freund L B,et al.Origin of compressive residual stress in polycrystalline thin films[J].Physical Review Letters,2002,88(15):156103-1-156103-4.
[4]Ma C H,Huang J H,Chen H.Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction[J].Thin Solid Films,2002,418(2):73-78.
[5]Ager III J W,Drory M D.Quantitative measurement of residual biaxial stress by Raman spectroscopy in diamond grown on a Ti alloy by chemical vapor deposition[J].Physical Review B,1993,48(4):2601-2607.
[6]Withers P J,Bhadeshia H.Residual stress.Part 2-Nature and origins[J].Materials science and technology,2001,17(4):366-375.
[7]张定铨,何定文.材料中残余应力的X射线衍射分析和作用[M].西安:西安交通大学出版社,1999.
[8]王桂芳,陈惠南.环芯法A,B释放系数的有限元计算[J].机械强度,1992,14(4):24-28.
[9]Moore M G,Evans W P.Mathematical correction for stress in removed layers in X-ray diffraction residual stress analysis[C]//SAE Technical Paper,[s.l.]:[s.n.],1958.
[10]李顺才,蔡瑜玮.材料力学实验教学若干思考[J].实验技术与管理,2010,27(12):158-160.
[11]孙建国.关于材料力学实验教学改革的设想[J].力学与实践,2004,26(3):88-89.
[12]刘维波,张小鹏.基础力学实验[M].大连:大连理工大学出版社,2011.
[13]Warren B E.X-ray Diffraction[M].[s.l.]:Courier Corporation,1969.
[14]徐芝纶.弹性力学(上,下)[M].北京:高等教育出版社,1990.
[15]吕克茂.残余应力测定的基本知识—第四讲X射线应力测定方法(一)[J].理化检验:物理分册,2007,43(7):349-354.
[16]孙文彬.开放性创新实验教学改革与实践[J].实验室研究与探索,2006,25(2):148-151.
[2]王秋成,柯映林.航空高强度铝合金残余应力的抑制与消除[J].航空材料学报,2002,22(3):59-62.
[3]Chason E,Sheldon B W,Freund L B,et al.Origin of compressive residual stress in polycrystalline thin films[J].Physical Review Letters,2002,88(15):156103-1-156103-4.
[4]Ma C H,Huang J H,Chen H.Residual stress measurement in textured thin film by grazing-incidence X-ray diffraction[J].Thin Solid Films,2002,418(2):73-78.
[5]Ager III J W,Drory M D.Quantitative measurement of residual biaxial stress by Raman spectroscopy in diamond grown on a Ti alloy by chemical vapor deposition[J].Physical Review B,1993,48(4):2601-2607.
[6]Withers P J,Bhadeshia H.Residual stress.Part 2-Nature and origins[J].Materials science and technology,2001,17(4):366-375.
[7]张定铨,何定文.材料中残余应力的X射线衍射分析和作用[M].西安:西安交通大学出版社,1999.
[8]王桂芳,陈惠南.环芯法A,B释放系数的有限元计算[J].机械强度,1992,14(4):24-28.
[9]Moore M G,Evans W P.Mathematical correction for stress in removed layers in X-ray diffraction residual stress analysis[C]//SAE Technical Paper,[s.l.]:[s.n.],1958.
[10]李顺才,蔡瑜玮.材料力学实验教学若干思考[J].实验技术与管理,2010,27(12):158-160.
[11]孙建国.关于材料力学实验教学改革的设想[J].力学与实践,2004,26(3):88-89.
[12]刘维波,张小鹏.基础力学实验[M].大连:大连理工大学出版社,2011.
[13]Warren B E.X-ray Diffraction[M].[s.l.]:Courier Corporation,1969.
[14]徐芝纶.弹性力学(上,下)[M].北京:高等教育出版社,1990.
[15]吕克茂.残余应力测定的基本知识—第四讲X射线应力测定方法(一)[J].理化检验:物理分册,2007,43(7):349-354.
[16]孙文彬.开放性创新实验教学改革与实践[J].实验室研究与探索,2006,25(2):148-151.