力学性能对于原子力显微镜接近曲线的影响
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摘要
该文基于Derjaguin-Muller-Toporov接触模型,研究了振幅调制原子力显微镜(AM-AFM))成像中,3种典型针尖悬臂系统与四类具有不同力学性能的材料样品在针尖样品接近过程中互作用的响应情况。研究表明相位响应与针尖样品相互作用力作用形式密切相关。通过针尖的振幅曲线可确定针尖与样品间的互作用力的性质是吸引还是排斥,本研究结果有助于在AM-AFM成像实验中优化基准值设置,以避免对样品的损害。
Based on the derjaguin-muller-toporov(DMT)contact model,the interaction response of three typical tip cantilever and four materials samples with different mechanical properties during the tip sample approaching were studied in the amplitude modulated atomic force microscopy(AM-AFM).It has been shown that the tip-sample interaction force is strongly related to the phase of the first harmonic.Furthermore,we can easily determine the distance in which the tip will affect the sample with attractive and repulsive interaction forces from the amplitude modulated approach curves,which is helpful for optimizing the setpoint in the scanning process of the amplitude-modulation atomic force microscopy(AM-AFM)imaging and avoiding the damage of the sample.
Based on the derjaguin-muller-toporov(DMT)contact model,the interaction response of three typical tip cantilever and four materials samples with different mechanical properties during the tip sample approaching were studied in the amplitude modulated atomic force microscopy(AM-AFM).It has been shown that the tip-sample interaction force is strongly related to the phase of the first harmonic.Furthermore,we can easily determine the distance in which the tip will affect the sample with attractive and repulsive interaction forces from the amplitude modulated approach curves,which is helpful for optimizing the setpoint in the scanning process of the amplitude-modulation atomic force microscopy(AM-AFM)imaging and avoiding the damage of the sample.
引文
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[8]HOLSCHER H,SCHWARZ U D.Theory of amplitude modulation atomic force microscopy with and without Q-control[J].Int J Non-Linear Mech,2007,42(4):608-625.
[9]KIRACOFE D,MELCHER J,RAMAN A.Gaining insight into the physics of dynamic atomic force microscopy in complex environments using the VEDA simulator[J].J Rev Sci Instrum,2012,83(1):013702.
[2]EBELING D,HOLSCHER H.Analysis of the constant-excitation mode in frequency-modulation atomic force microscopy with active Q-control applied in ambient conditions and liquids[J].J Appl Phys,2007,102(11):114310.
[3]BOLDYREVA K,PINTILIE L,LOTNYK A,et al.Thickness-driven antiferroelectric-to-ferroelectric phase transition of thin PbZrO3 layers in epitaxial PbZrO3/PbZr0.8Ti0.2O3 multilayers[J].J Appl Phys Lett,2007,91(12):122915.
[4]NONY L,BOISGARD R,AIME J P.Stability criterions of an oscillating tip-cantilever system in dynamic force microscopy[J].J Eur Phys J B,2001,24(2):221-229.
[5]LEE S I,HOWELL S W,RAMAN A,et al.Nonlinear dynamics of microcantilevers in tapping mode atomic force microscopy:A comparison between theory and experiment[J].Phys Rev B,2002,66(11):115409.
[6]SAN P A,GARCIA R.Unifying theory of tappingmode atomic-force microscopy[J].J Phys Rev B,2002,66(4):114310.
[7]KLINOV D,MAGONOV S.True molecular resolution in tapping-mode atomic force microscopy with highresolution probes[J].J Appl Phys Lett,2004,84(14):2697-2699.
[8]HOLSCHER H,SCHWARZ U D.Theory of amplitude modulation atomic force microscopy with and without Q-control[J].Int J Non-Linear Mech,2007,42(4):608-625.
[9]KIRACOFE D,MELCHER J,RAMAN A.Gaining insight into the physics of dynamic atomic force microscopy in complex environments using the VEDA simulator[J].J Rev Sci Instrum,2012,83(1):013702.