TFT-LCD横纹不良研究与改善
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摘要
本文研究了一款TFT-LCD HADS产品出现的21.4%横纹不良。通过分析和改善研究表明,产生横纹的根本原因是V_(com)反馈信号与CLK_1、CLK_2、CLK_3信号产生耦合效应及V_(com)补偿电路共同作用下,导致V_(com)在栅压关闭前存在三上三下的周期性波动,形成三行暗三行亮水平粗纹;根据原理分析进行不良改善实验验证,最终通过调整降低V_(com)补偿电路倍数,将该不良降低至0%。
In this paper,we explore a kind of horizontal stripes defect which happened 21.4% in TFT-LCD HADS product.Through analysis and improvement study,the main reason for horizontal stripes defect was the coupling effect of V_(com) Feedback signal and CLK_1,CLK_2,CLK_3 signal,and V_(com)compensation circuit.As a result,there are three periodic fluctuations of V_(com)before Gate closing,which form three lines of dark and three lines of bright horizontal rough lines.According to the principle analysis,the defect improvement experiment is verified.Finally,by adjusting the V_(com)compensation circuit multiple,the defect is reduced to 0%.
In this paper,we explore a kind of horizontal stripes defect which happened 21.4% in TFT-LCD HADS product.Through analysis and improvement study,the main reason for horizontal stripes defect was the coupling effect of V_(com) Feedback signal and CLK_1,CLK_2,CLK_3 signal,and V_(com)compensation circuit.As a result,there are three periodic fluctuations of V_(com)before Gate closing,which form three lines of dark and three lines of bright horizontal rough lines.According to the principle analysis,the defect improvement experiment is verified.Finally,by adjusting the V_(com)compensation circuit multiple,the defect is reduced to 0%.
引文
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