基于深亚微米的低成本高可靠BOD电路
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摘要
经常在MCU等应用系统中遇到系统电源电压出现欠压或意外掉电的情况,导致MCU的程序"跑飞"或丢失重要的数据。为了尽量避免这些情况的出现,掉电检测电路能够检测到系统供电电源异常,以提高系统的抗干扰能力和稳定性。提出一种基于180 nm工艺设计的掉电检测电路,具有结构简单、工作稳定可靠、版图面积小的优点,可集成在MCU等微处理器内部,实现对系统电源电压监测,减少系统的外围器件,降低系统成本。该电路结构可以非常容易地迁移至其他工艺节点,具备良好的工艺迁移特性和应用广泛性。
In MCU and other application systems, the system power supply voltage is often under-voltage or unexpectedly power-off,resulting in the MCU program " run away " or loss of important data. In order to avoid these situations as far as possible, the brown-out detection circuit can detect the abnormal power supply of the system, so as to improve the anti-interference ability and stability of the system. In this paper, a brown-out detection circuit based on 180 nm technology is proposed, which has the advantages of simple structure, stable and reliable operation and small layout area. It can be integrated into MCU and other microprocessors to monitor the power supply voltage of the system, reduce the peripheral devices of the system and reduce the system cost. The circuit structure can be easily migrated to other process nodes, and has good process migration characteristics and wide application.
In MCU and other application systems, the system power supply voltage is often under-voltage or unexpectedly power-off,resulting in the MCU program " run away " or loss of important data. In order to avoid these situations as far as possible, the brown-out detection circuit can detect the abnormal power supply of the system, so as to improve the anti-interference ability and stability of the system. In this paper, a brown-out detection circuit based on 180 nm technology is proposed, which has the advantages of simple structure, stable and reliable operation and small layout area. It can be integrated into MCU and other microprocessors to monitor the power supply voltage of the system, reduce the peripheral devices of the system and reduce the system cost. The circuit structure can be easily migrated to other process nodes, and has good process migration characteristics and wide application.
引文
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[10]徐一,马永旺,何洋,等.一种应用开关电容分压的电源电压检测电路[J].电子器件,2018,41(4):924-927.
[11]毕查德·拉扎维.模拟CMOS集成电路设计[M].陈贵灿,程军,张瑞智,等,译.西安:西安交通大学出版社,2003.
[2]高希栋.一种智能电能表掉电检测模块的电路设计[J].机电信息,2018(15):147,149.
[3]江浩.CMOS掉电检测及保护电路设计[J].中国集成电路,2010(12):56-59.
[4]杨洁,李阳军,黄海深,等.一种具有长复位延时的上电复位电路的设计[J].信阳师范学院学报(自然科学版),2016,29(2):257-260.
[5]YASUDA T,YAMAMOTO M,NISHI T.A power-on reset pulse generator for low voltage applications[C].The 2001IEEE International Symposium on Circuits and Systems.IEEE,20014:599-601.
[6]WADHWA S K,SIDDHARTHA G K,GAURAV A.Zero steady state current power-on-reset circuit with brown-out detector[C].19th International Conference on VLSI Design,2006.Held Jointly with 5th International Conference on Embedded Systems and Design.IEEE,2006.
[7]单伟伟,周垚,吴建辉.一种具有零稳态电流的新型上电复位电路[J].东华大学学报(自然科学版),2012,38(2):213-218.
[8]Shan Weiwei,Wang Xuexiang,Liu Xinning,et al.An ul tra low steady-state current power-on-reset circuit in 65 nm CMOS technology[J].Chinese Journal of Electronics,2014,23(4):678-681.
[9]LE H B,DO X D,LEE S G,et al.A long reset-time power-on reset circuit with brown-out detection capability[J].IEEE Transactions on Circuits and Systems II:Express Briefs,2011,58(11):778-782.
[10]徐一,马永旺,何洋,等.一种应用开关电容分压的电源电压检测电路[J].电子器件,2018,41(4):924-927.
[11]毕查德·拉扎维.模拟CMOS集成电路设计[M].陈贵灿,程军,张瑞智,等,译.西安:西安交通大学出版社,2003.