基于LabVIEW的排阻老化电阻值测试系统
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  • 英文篇名:A Lab VIEW-based system for testing resistance values during pack resistor aging
  • 作者:田恬 ; 肖仕武
  • 英文作者:TIAN Tian;XIAO Shiwu;School of Electrical & Electronic Engineering,North China Electric Power University;
  • 关键词:电阻值 ; 老化 ; 排阻 ; LabVIEW ; 数字万用表 ; 测试效率
  • 英文关键词:resistance value;;aging;;pack resistor;;LabVIEW;;digital multimeter;;testing efficiency
  • 中文刊名:XDDJ
  • 英文刊名:Modern Electronics Technique
  • 机构:华北电力大学电气与电子工程学院;
  • 出版日期:2018-08-14 16:04
  • 出版单位:现代电子技术
  • 年:2018
  • 期:v.41;No.519
  • 语种:中文;
  • 页:XDDJ201816002
  • 页数:5
  • CN:16
  • ISSN:61-1224/TN
  • 分类号:13-16+20
摘要
针对目前排阻老化过程中电阻值测试存在的劳动效率低下、误差大、重测现象突出、成本高等问题,设计基于Lab VIEW开发平台的排阻老化过程中电阻值测试系统。系统由计算机、数字万用表、测试表笔、信号转换盒和待测排阻构成。实现了测试记录的自动化,提高了排阻测试工序的自动化程度,以及排阻老化试验电阻值的测试效率,并且能有效降低老化试验的人工成本、减少人为的失误和重测现象,具有结构简单、界面友好、操作方便、读数直观、成本低廉、开发简洁高效、灵活更新升级的特点。
        In allusion to the problems of low labor efficiency,big error,lots of repetitive tests,and high cost in the current resistance value test during the pack resistor aging process,a system for testing resistance values during the pack resistor aging process is designed based on the Lab VIEW development platform. The system is composed of the computer,digital multimeter,tester pen,signal conversion box,and to-be-tested pack resistor,which can realize the automation of testing and recording,improve the automation degree of the pack resistor test process and the resistance value testing efficiency of the pack resistor aging test,and effectively reduce the labor cost,human errors and repetitive tests in the aging test. The system has the characteristics of simple structure,friendly interface,easy operation,intuitive reading,low cost,simple and efficient development,and flexible update and upgrade.
引文
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