基于等效辐射源替代法的辐射温度计校准方法研究
详细信息    查看全文 | 推荐本文 |
  • 英文篇名:Research on Calibration Method of Radiation Thermometer Based on Alternative Radiation Source Replacement Method
  • 作者:赵丹侠 ; 杜文岚
  • 英文作者:ZHAO Danxia;DU Wenlan;Taizhou Institute of Metrology Technology;
  • 关键词:辐射温度计 ; 固定发射率 ; 黑体辐射源
  • 英文关键词:radiation thermometer;;fixed emissivity;;blackbody radiation source
  • 中文刊名:XDXK
  • 英文刊名:Modern Information Technology
  • 机构:台州市计量技术研究院;
  • 出版日期:2019-05-10
  • 出版单位:现代信息科技
  • 年:2019
  • 期:v.3
  • 语种:中文;
  • 页:XDXK201909012
  • 页数:3
  • CN:09
  • ISSN:44-1736/TN
  • 分类号:37-39
摘要
针对现有检定规程无法检定发射率固定的辐射温度计的问题,提出一种基于等效辐射源替代法的方案。结合带通辐射温度计的特点,建立辐射温度计测量模型,基于辐射温度计接收光谱有效亮度相等的前提下,结合测量模型得出利用现有有效发射率为0.995的黑体辐射源来等效替代发射率为0.95的辐射源的计算公式,并计算出各个校准点下替代源的理论温度值。
        Aiming at the problem that the existing verification procedures can not verify the radiation thermometer with fixed emissivity,a scheme based on the equivalent radiation source replacement method is proposed. Combined with the characteristics of the band-pass radiation thermometer,the radiation thermometer measurement model is established. Based on the premise that the radiation thermometer receives the equal effective brightness of the spectrum,the measurement model is used to obtain the equivalent replacement emissivity using the existing black body radiation source with an effective emissivity of 0.995. Calculate the formula for the source of 0.95 and calculate the theoretical temperature value of the alternate source at each calibration point.
引文
[1]原遵东.黑体辐射源发射率对辐射测温准确度的影响及修正方法[J].计量学报,2007,28(z1):19-22.
    [2]原遵东,段宇宁,王铁军,等.发射率设定值不为1的辐射温度计的校准[J].计量技术,2007(5):43-46.
    [3]宋向英.500℃以下工作用辐射温度计校准结果示值修正方法探讨[J].计测技术,2005(6):76-77.
    [4]王文革.固定发射率辐射温度计校准中的温度修正计算方法[J].宇航计测技术,2006(2):17-23.
    [5]崔超,余时帆,方晓琴,等.红外线辐射温度计的校准[J].工业计量,2010,20(S2):155-157+198.
    [6]Saunders,P.Calibration of Low Temperature Infrared Thermoeters[J].Measurement Standards Lab of New Zealand,2009(22):1-4.

© 2004-2018 中国地质图书馆版权所有 京ICP备05064691号 京公网安备11010802017129号

地址:北京市海淀区学院路29号 邮编:100083

电话:办公室:(+86 10)66554848;文献借阅、咨询服务、科技查新:66554700