基于LabVIEW的平面度检测系统设计
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  • 英文篇名:Flatness Detection System Design Based on LabVIEW
  • 作者:刘希军 ; 魏麟 ; 朱新宇 ; 刘小涵
  • 英文作者:LIU Xi-jun;WEI Lin;ZHU Xin-yu;LIU Xiao-han;Aviation Engineering Institute,Civil Aviation Flight University of China;
  • 关键词:LabVIEW ; 平面度 ; C8051F120 ; 串口通讯 ; RS232 ; 人机交互界面关
  • 英文关键词:LabVIEW;;flatness;;C8051F120;;serial communication;;RS232;;interactive interface
  • 中文刊名:YBJS
  • 英文刊名:Instrument Technique and Sensor
  • 机构:中国民用航空飞行学院航空工程学院;
  • 出版日期:2018-05-15
  • 出版单位:仪表技术与传感器
  • 年:2018
  • 期:No.424
  • 基金:民航科技引导资金项目(2146905)
  • 语种:中文;
  • 页:YBJS201805016
  • 页数:4
  • CN:05
  • ISSN:21-1154/TH
  • 分类号:65-68
摘要
以图形方式集成化程序开发环境LabVIEW为基础,设计研发平面度检测系统。系统采用电涡流位移传感器布点测量采集平板信息,并由SOC系统级MCU芯片C8051F120智能处理,通过RS232串口通讯与上位机通讯。上位机采用LabVIEW设计程控交互界面,包括检测系统配置界面、平板数据采集界面、已测数据查询面等多界面程序开发,方便用户操作使用。平面度检测系统已用于工业平板平面度检测。
        The flatness detection system was designed and developed based on a graphical integrated development environment of LabVIEW. The system used eddy current displacement sensors to distribute measurement dots and collect information which is intelligently processed by the SOC system-level MCU chip C8051 F120 and transmitted via RS232 serial to the host computer.The system used the LabVIEW to design the interfaces,including the detection system configuration interface,flatness data acquisition interface,measured data query interface and other interfaces,which is user-friendly.The flatness detection system has been applied to industrial panel flatness detection.
引文
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