基于SRAM型FPGA可重构技术的故障注入系统设计
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摘要
空间辐射环境会导致SRAM型FPGA发生单粒子翻转问题,空间应用需要采取缓解单粒子翻转的加固措施,而加固措施的有效性需要在地面进行重离子辐照试验评估,但试验周期长、成本高,且具有破坏性。基于SRAM型FPGA的动态可重构特性,在研究FPGA配置存储器结构及配置结构的基础上,通过修改配置存储区数据,形成了基于数据库回放的故障注入系统来模拟FPGA的SEU效应,从而加速系统的失效过程。对比辐照试验结果表明,此方法成本低、设计灵活,为SRAM型FPGA抗单粒子容错设计提供了有利支持。
The space radiation environment can cause the single event upsets of SRAM-based FPGA,space applications need to take mitigation of single particle rollover reinforcement measures,the effectiveness of reinforcement measures needs to be evaluated by heavy ion irradiation in the laboratory,but the test cycle is long,the cost is high,and is destructive. In this paper,based on the dynamic reconfiguration of SRAM-base,based on the research of FPGA configuration structure,by modifying the configuration data,a fault injection system based on database replay is formed to simulate the SEU effect of FPGA,the method accelerated the process of system failure,Results show that the method has low cost and flexible design,and provides favorable support for SRAM-based FPGA anti-tolerant design.
The space radiation environment can cause the single event upsets of SRAM-based FPGA,space applications need to take mitigation of single particle rollover reinforcement measures,the effectiveness of reinforcement measures needs to be evaluated by heavy ion irradiation in the laboratory,but the test cycle is long,the cost is high,and is destructive. In this paper,based on the dynamic reconfiguration of SRAM-base,based on the research of FPGA configuration structure,by modifying the configuration data,a fault injection system based on database replay is formed to simulate the SEU effect of FPGA,the method accelerated the process of system failure,Results show that the method has low cost and flexible design,and provides favorable support for SRAM-based FPGA anti-tolerant design.
引文
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[5]绳伟光,肖立伊,毛志刚.用于电路级仿真软故障注入的自动化方法[J].计算机辅助设计与图形学报,2009,21(3):346-353.
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[7]Violante M,Sterpone L,Ceschia M,et al.Simulation-based analysis of SEU effects in SRAM-based FPGAs[J].IEEE Transactions on Nuclear Science,2004,51(6):3354-3359.
[8]Manuzzato A,Gerardin S,Paccagnella A,et al.Effectiveness of TMR-based techniques to mitigate alpha-induced SEU accumulation in commercial SRAM-based FPGAs[J].IEEE Transactions on Nuclear Science,2008,55(4):1968-1973.
[9]姚志斌,张凤祁,何宝平,等.静态随机访问存储器型现场可编程门阵列辐照效应测试系统研制[J].强激光与粒子束,2009,21(5):749-754.
[2]李华旺,刘海涛,杨根庆,等.航天单粒子事件故障注入系统研究[J].量子电子学报,2002,19(1):57-60.
[3]刑克飞,杨俊,王跃科,等.Xilinx SRAM型FPGA抗辐射设计技术研究[J].宇航学报,2007,28(1):123-151.
[4]Wang X,Xu Z.A novel fault Injection algorithm for safety analysis[C]//Engineering and Technology(S-CET),2012 Spring Congress on.IEEE,2012:1-4.
[5]绳伟光,肖立伊,毛志刚.用于电路级仿真软故障注入的自动化方法[J].计算机辅助设计与图形学报,2009,21(3):346-353.
[6]何伟.SRAM型FPGA单粒子故障传播特性与测试方法研究[D].长沙:国防科技大学,2011.
[7]Violante M,Sterpone L,Ceschia M,et al.Simulation-based analysis of SEU effects in SRAM-based FPGAs[J].IEEE Transactions on Nuclear Science,2004,51(6):3354-3359.
[8]Manuzzato A,Gerardin S,Paccagnella A,et al.Effectiveness of TMR-based techniques to mitigate alpha-induced SEU accumulation in commercial SRAM-based FPGAs[J].IEEE Transactions on Nuclear Science,2008,55(4):1968-1973.
[9]姚志斌,张凤祁,何宝平,等.静态随机访问存储器型现场可编程门阵列辐照效应测试系统研制[J].强激光与粒子束,2009,21(5):749-754.